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Ferromagnetism and magnetoresistance in monolayered manganites Ca2-xLnxMnO4”. Maignan A, Martin C, Van Tendeloo G, Hervieu M, Raveau B, Journal of materials chemistry 8, 2411 (1998). http://doi.org/10.1039/a805393f
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FIB/SEM applied to quantitative 3D analysis of precipitates in Ni-Ti”. Cao S, Nishida M, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 1284 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.1284
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Fine structure of CMR perovskites by HREM and CBEM”. Van Tendeloo G, Richard O, Schuddinck W, Hervieu M, Electron microscopy: vol. 1 , 383 (1998)
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First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs”. Rosenauer A, Schowalter M, Glas F, Lamoen D, 107, 151 (2005)
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Govaerts K (2015) First-principles study of homologous series of layered Bi-Sb-Te-Se and Sn-O structures. Antwerpen
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Tan H (2012) From EELS to oxidation state mapping : an investigation into oxidation state mapping of transition metals with electron energy-loss spectroscopy. Antwerpen
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Shi H (2014) From functional properties to micro/nano-structures : a TEM study of NiTiNb shape memory alloys. Antwerpen
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From polyester grafting onto POSS nanocage by ring-opening polymerization to high performance polyester/POSS nanocomposites”. Goffin A-L, Duquesne E, Raquez J-M, Miltner HE, Ke X, Alexandre M, Van Tendeloo G, van Mele B, Dubois P, Journal of materials chemistry 20, 9415 (2010). http://doi.org/10.1039/c0jm00283f
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From the lattice measurements of the austenite and the martensite cells to the macroscopic mechanical behavior of shape memory alloys”. Lexcellent C, Vivet A, Bouvet C, Blanc P, Satto C, Schryvers D, Journal de physique: 4 11, 317 (2001)
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Ke X (2010) From top-down to bottom-up : from carbon nanotubes to nanodevices. Antwerpen
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Khaletskaya K (2014) Functional metal-organic frameworks : from bulk to surface engineered properties. Antwerpen
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Gas-phase loading of [Zn4O(btb)2] (MOF-177) with organometallic CVD-precursors: inclusion compounds of the type [LnM]a@MOF-177 and the formation of Cu and Pd nanoparticles inside MOF-177”. Müller M, Lebedev OI, Fischer RA, Journal of materials chemistry 18, 5274 (2008). http://doi.org/10.1039/b810989c
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Gold particles supported on TiO2”. Giorgio S, Henry CR, Pauwels B, Van Tendeloo G, , 369 (2000)
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Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties”. Kuhn LT, Vanhoutte F, Cannaerts M, Neukermans S, Verschoren G, Bouwen W, van Haesendonck C, Lievens P, Silverans RE, Pauwels B, Van Tendeloo G, (2000)
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Growth mechanism of biaxially aligned magnesium oxide deposited by unbalanced magnetron sputtering”. Ghekiere P, Mahieu S, De Winter G, De Gryse R, Depla D, Lebedev OI, Diffusion and defect data : solid state data : part B : solid state phenomena T2 –, 2nd International Conference on Texture and Anisotropy of Polycrystals, JUL 07-09, 2004, Metz, FRANCE 105, 433 (2005). http://doi.org/10.4028/www.scientific.net/SSP.105.433
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Growth of R1+xBa2-xCu3O7-\delta epitaxial films investigated by in situ scanning tunneling microscopy”. Salluzzo M, Aruta C, Maggio-Aprile I, Fischer Ø, Bals S, Zegenhagen J, Physica status solidi: A: applied research 186, 339 (2001). http://doi.org/10.1002/1521-396X(200108)186:3<339::AID-PSSA339>3.0.CO;2-5
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Amelinckx S, van Dyck D, van Landuyt J, Van Tendeloo G (1997) Handbook of microscopy: applications in materials science, solid-state physics and chemistry. Vch, Weinheim
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High electron mobility in AlGaN/GaN HEMT grown on sapphire: strain modification by means of AIN interlayers”. Germain M, Leys M, Boeykens S, Degroote S, Wang W, Schreurs D, Ruythooren W, Choi K-H, van Daele B, Van Tendeloo G, Borghs G, Materials Research Society symposium proceedings 798, Y10.22 (2004)
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High precision determination of the elastic strain of InGaN/GaN multiple quantum wells”. Wu MF, Zhou S, Yao S, Zhao Q, Vantomme A, van Daele B, Piscopiello E, Van Tendeloo G, Tong YZ, Yang ZJ, Yu TJ, Zhang GY, Journal of vacuum science and technology: B: microelectronics and nanometer structures 22, 920 (2004). http://doi.org/10.1116/1.1715085
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High resolution electron microscopy in materials research”. Van Tendeloo G, Journal of materials chemistry 8, 797 (1998). http://doi.org/10.1039/a708240a
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High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Ju HL, Krishnan KM, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 80, 673 (2000). http://doi.org/10.1080/01418610008212075
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High resolution TEM observation of in situ colloid formation in CaF2 crystals”. Teodorescu VS, Nistor LC, van Landuyt J, Materials science forum 239-241, 671 (1997)
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High resolution transmission electron microscopy study of nanoscale Ni-rich Ni-Al films evaporated onto NaCl and KCl”. Yandouzi M, Toth L, Schryvers D, Nanostructured materials 10, 99 (1998). http://doi.org/10.1016/S0965-9773(98)00025-7
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High-resolution visualization techniques : structural aspects”. Schryvers D, Van Aert S Springer, Berlin, page 135 (2012).
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HREM for characterisation of nanoscale microstructures”. van Landuyt J, Van Tendeloo G, , 15 (1998)
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HREM investigation of a Fe/GaN/Fe tunnel junction”. Nistor L, Bender H, van Landuyt J, Nemeth S, Boeve H, De Boeck J, Borghs G, Institute of physics conference series T2 –, Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England , 53 (2001)
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HREM investigation of La(1-x)Ca(x)MnO3-delta thin films”. Lebedev O, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, , 517 (1998)
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HREM investigation of La1-xCaxMnO3- thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier H-U, Electron microscopy: vol. 2 , 517 (1998)
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HREM of defects in cubic boron nitride single crystals”. Nistor LC, van Landuyt J, Dincã, G, , 695 (1998)
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HRTEM studies of dislocations in cubic BN”. Nistor LC, Van Tendeloo G, Dincã, G, Physica status solidi: A: applied research 201, 2578 (2004). http://doi.org/10.1002/pssa.200405192
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