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“Modelling of radio frequency capacitively coupled plasma at intermediate pressures”. Berezhnoi S, Kaganovich I, Bogaerts A, Gijbels R Kluwer Academic, Dordrecht, page 525 (1999).
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“Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
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“Nanodesign of combined micro- and mesoporous materials for specific applications in adsorption and catalysis”. Meynen V, Busuioc AM, Beyers E, Cool P, Vansant EF, Bilba N, Mertens M, Lebedev O, Van Tendeloo G Nova, New York (2007).
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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2007).
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“Numerical modelling of analytical glow discharges”. Bogaerts A, Gijbels R Wiley, Chichester, page 155 (2003).
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“Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides”. Nikolaev AV, Michel KH, Copley JRD Plenum Press, New York, page 183 (1999).
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“The phase diagram”. Peeters FM Kluwer Academic Publishers, Dordrecht, page 17 (1997).
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“Photographic materials”. Verlinden G, Gijbels R, Geuens I Surface Spectra IM, Chichester, page 727 (2001).
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“Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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“Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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“Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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“Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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“Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
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“Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
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“Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques”. Oleshko VP, Gijbels RH, Jacob WA, van Daele AJ Antwerp, page 317 (1998).
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“Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film”. Lebedev O, Verbeeck J, Van Tendeloo G, Shapoval O, Belenchuk A, Moshnyaga V, Damaschke B, Samwer K s.l., page 1013 (2002).
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“Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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“Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R Antwerp, page 528 (1998).
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“Transport in nanostructures”. Magnus W, Carrillo-Nunez H, Sorée B Pan Stanford, S.l. (2011).
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“Analysis of thermal waters by ICP-MS”. Veldeman E, Van 't dack L, Gijbels R, Campbell M, Vanhaecke F, Vanhoe H, Vandecasteele C The Royal Society of Chemistry, Cambridge, page 25 (1991).
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“Atomic mass spectrometry”. Gijbels R, Oksenoid KG Academic Press, London, page 2839 (1995).
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“Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M Editions de physique, Les Ulis, page 701 (1994).
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“Crystal chemistry of mercury based layered cuprates and oxycarbonates”. Raveau B, Hervieu M, Michel C, Martin C, Maignan A, Van Tendeloo G Narosa, New Delhi, page 132 (1995).
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“Electron microscopic study of long period ordering in complex oxides”. Amelinckx S, Nistor LC, Van Tendeloo G s.l., page 1 (1994).
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“Electron microscopy of interfaces in new materials”. Van Tendeloo G, Goessens C, Schryvers D, van Haverbergh J, de Veirman A, van Landuyt J s.l., page 200 (1991).
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“Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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“A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis”. van Roy W, Struyf H, van Vaeck L, Gijbels R, Caravatti P Wiley, Chichester, page 463 (1994).
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“Fundamental aspects of an analytical glow discharge”. van Straaten M, Gijbels R Royal Society of Chemistry, Cambridge, page 130 (1993).
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“Geothermal water analysis by X-ray fluorescence and neutron activation”. van Grieken R, Gijbels R, Blommaert W, Vandelannoote R, Van 't dack L US Energy Research and Development Administration, S.l., page 368 (1978).
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