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“Light-induced selective deposition of Au nanoparticles on single-wall carbon nanotubes”. Quintana M, Ke X, Van Tendeloo G, Meneghetti M, Bittencourt C, Prato M, ACS nano 4, 6105 (2010). http://doi.org/10.1021/nn101183y
Abstract: Novel applications of single-walled carbon nanotubes (SWNT) rely on the development of new strategies to make them easier to handle without affecting their structural properties. In this work, we have selectively deposited Au nanoparticles (Au NP) on SWNT assisted by UV light irradiation. XPS analysis and UV-vis spectroscopy indicate that the deposition occurs at the defects generated after oxidation of the SWNT. By addition of n-dodecylthiol, the separation of oxidized tubes with Au NP (Au-ox-SWNT) from tubes devoid of Au NP (bare tubes, b-SWNT) was achieved. Raman and UV-vis-NIR spectra indicate that UV irradiation induces a faster nucleation of Au NP on metallic SWNT. This new technique can be useful for the preparation of nanohybrid composites with enhanced properties, as increased thermal stability, and to obtain purified SWNT.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 13.942
Times cited: 26
DOI: 10.1021/nn101183y
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“Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy”. Felten A, Gillon X, Gulas M, Pireaux J-J, Ke X, Van Tendeloo G, Bittencourt C, Najafi E, Hitchcock AP, ACS nano 4, 4431 (2010). http://doi.org/10.1021/nn1002248
Abstract: The presence of defects in carbon nanotubes strongly modifies their electrical, mechanical, and chemical properties. It was long thought undesirable, but recent experiments have shown that introduction of structural defects using ion or electron irradiation can lead to novel nanodevices. We demonstrate a method for detecting and quantifying point defect density in individual carbon nanotubes (CNTs) based on measuring the polarization dependence (linear dichroism) of the C 1s → π* transition at specific locations along individual CNTs with a scanning transmission X-ray microscope (STXM). We show that STXM can be used to probe defect density in individual CNTs with high spatial resolution. The quantitative relationship between ion dose, nanotube diameter, and defect density was explored by purposely irradiating selected sections of nanotubes with kiloelectronvolt (keV) Ga+ ions. Our results establish polarization-dependent X-ray microscopy as a new and very powerful characterization technique for carbon nanotubes and other anisotropic nanostructures.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 13.942
Times cited: 26
DOI: 10.1021/nn1002248
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“Study of the interface between rhodium and carbon nanotubes”. Suarez-Martinez I, Ewels CP, Ke X, Van Tendeloo G, Thiess S, Drube W, Felten A, Pireaux J-J, Ghijsen J, Bittencourt C, ACS nano 4, 1680 (2010). http://doi.org/10.1021/nn9015955
Abstract: X-ray photoelectron spectroscopy at 3.5 keV photon energy, in combination with high-resolution transmission electron microscopy, is used to follow the formation of the interface between rhodium and carbon nanotubes. Rh nucleates at defect sites, whether initially present or induced by oxygen-plasma treatment. More uniform Rh cluster dispersion is observed on plasma-treated CNTs. Experimental results are compared to DFT calculations of small Rh clusters on pristine and defective graphene. While Rh interacts as strongly with the carbon as Ti, it is less sensitive to the presence of oxygen, suggesting it as a good candidate for nanotube contacts.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 13.942
Times cited: 26
DOI: 10.1021/nn9015955
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“Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM”. Guttmann P, Bittencourt C, Rehbein S, Umek P, Ke X, Van Tendeloo G, Ewels CP, Schneider G, Nature photonics 6, 25 (2012). http://doi.org/10.1038/NPHOTON.2011.268
Abstract: Near-edge X-ray absorption spectroscopy (NEXAFS)1 is an essential analytical tool in material science. Combining NEXAFS with scanning transmission X-ray microscopy (STXM) adds spatial resolution and the possibility to study individual nanostructures2, 3. Here, we describe a full-field transmission X-ray microscope (TXM) that generates high-resolution, large-area NEXAFS data with a collection rate two orders of magnitude faster than is possible with STXM. The TXM optical design combines a spectral resolution of E/ΔE = 1 × 104 with a spatial resolution of 25 nm in a field of view of 1520 µm and a data acquisition time of ~1 s. As an example, we present image stacks and polarization-dependent NEXAFS spectra from individual anisotropic sodium and protonated titanate nanoribbons. Our NEXAFS-TXM technique has the advantage that one image stack visualizes a large number of nanostructures and therefore already contains statistical information. This new high-resolution NEXAFS-TXM technique opens the way to advanced nanoscale science studies.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 37.852
Times cited: 76
DOI: 10.1038/NPHOTON.2011.268
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