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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
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Even, A.; ten Brink, H.M.; Khlystov, A.; Smekens, A.; Berghmans, P.; Van Grieken, R. |
The influence of black carbon on the crystallization point of salt aerosol |
2000 |
Journal of aerosol science |
31 |
|
UA library record |
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|
Osán, J.; Szalóki, I.; Ro, C.-U.; Van Grieken, R. |
Light element analysis of individual microparticles using thin-window EPMA |
2000 |
Microchimica acta |
132 |
|
UA library record; WoS full record; WoS citing articles |
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Osán, J.; Ro, C.-U.; Szalóki, I.; Worobiec, A.; de Hoog, J.; Joos, P.; Van Grieken, R. |
Methodology for light element analysis of individual aerosol particles using thin-window EPMA |
2000 |
Journal of aerosol science |
31 |
|
UA library record |
|
|
de Hoog, J.; Osán, J.; Worobiec, A.; Ro, C.-U.; Szalóki, I.; Joos, P.; Van Grieken, R. |
Optimisation of light element analysis of individual particles using UTW-EPMA |
2000 |
Journal of aerosol science |
31 |
|
UA library record |
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|
Kuczumow, A.; Claes, M.; Schmeling, M.; Van Grieken, R.; de Gendt, S. |
Quantification problems in light element determination by grazing emission X-ray fluorescence |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
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|
Szalóki, I.; Braun, M.; Van Grieken, R. |
Quantitative characterisation of the leaching of lead and other elements from glazed surfaces of historical ceramics |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
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|
Szalóki, I.; Osán, J.; Ro, C.-U.; Van Grieken, R. |
Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
|
UA library record; WoS full record; WoS citing articles |
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Injuk, J.; Van Grieken, R. |
Sample preparation for X-ray fluorescence analysis |
2000 |
|
15 |
|
UA library record |
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de Bock, L.A.; Joos, P.E.; Noone, K.J.; Pockalny, R.A.; Van Grieken, R.E. |
Single particle analysis of aerosols, observed in the marine boundary layer during the Monterey Area Ship Tracks Experiment (MAST), with respect to cloud droplet formation |
2000 |
Journal of atmospheric chemistry |
37 |
|
UA library record; WoS full record; WoS citing articles |
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Jambers, W.; Dekov, V.; Van Grieken, R. |
Single particle and inorganic characterization of rainwater collected above the North Sea |
2000 |
The science of the total environment |
256 |
|
UA library record; WoS full record; WoS citing articles |
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Smekens, A.; Berghmans, P.; Van Grieken, R. |
The size distribution and surface area of soot emitted by different sources |
2000 |
Journal of aerosol science |
31 |
|
UA library record |
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van Dyck, K.; Robberecht, H.; van Cauwenbergh, R.; Deelstra, H.; Arnaud, J.; Willemyns, L.; Benijts, F.; Centeno, J.A.; Taylor, H.; Soares, M.E.; Bastos, M.L.; Ferreira, M.A.; d'Haese, P.C.; Lamberts, L.V.; Hoenig, M.; Knapp, G.; Lugowski, S.J.; Moens, L.; Riondato, J.; Van Grieken, R.; Claes, M.; Verheyen, R.; Clement, L.; Uytterhoeven, M. |
Spectrometric determination of silicon in food and biological samples: an interlaboratory trial |
2000 |
Journal of analytical atomic spectrometry |
15 |
|
UA library record; WoS full record; WoS citing articles |
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Van Grieken, R.; Injuk, J.; de Bock, L.; van Malderen, H. |
Study of individual particle types and heavy metal deposition for North Sea aerosols using micro and trace analysis techniques |
2000 |
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UA library record |
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Worobiec, A.; de Hoog, J.; Osán, J.; Szalóki, I.; Joos, P.; Van Grieken, R. |
Unconventional microanalysis for low-Z, volatile and organic aerosol compounds |
2000 |
Journal of aerosol science |
31 |
|
UA library record |
|
|
Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. |
X-ray spectrometry |
2000 |
Analytical chemistry |
72 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Van Grieken, R.E. |
X-ray spectrometry |
2000 |
|
15 |
|
UA library record |
|
|
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. |
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate |
2000 |
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UA library record |
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Van Tendeloo, G.; Schryvers, D. |
Atomic structure of alloys close to phase transitions |
2000 |
Nucleation and growth processes in materials |
580 |
|
UA library record; WoS full record; |
|
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Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. |
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties |
2000 |
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UA library record |
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Vernochet, C.; Vannier, R.-N.; Huvé, M.; Pirovano, C.; Nowogrocki, G.; Mairesse, G.; Van Tendeloo, G. |
Chemical, structural and electrical characterizations in the BIZNVOX family |
2000 |
Journal of materials chemistry |
10 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
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Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al. |
Comparative study of structural properties and photoluminescence in InGaN layers with a high In content |
2000 |
Internet journal of nitride semiconductor research
T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS |
5 |
|
UA library record; WoS full record; |
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Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. |
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study |
2000 |
|
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UA library record; WoS full record; |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
|
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UA library record; WoS full record; |
|
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Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
|
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UA library record |
|
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
|
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Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
|
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Romano-Rodriguez, A.; Perez-Rodriguez, A.; Serre, C.; van Landuyt, J.; et al. |
Epitaxial growth of \beta-SiC on ion-beam synthesized \beta-SiC : structural characterization |
2000 |
Materials science forum
T2 – International Conference on Silicon Carbide and Related Materials, OCT 10-15, 1999, RES TRIANGLE PK, NORTH CAROLINA |
338-3 |
2 |
UA library record; WoS full record; WoS citing articles |
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|
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
|
|
Riva, C.; Peeters, F.M.; Varga, K. |
Excitons and charged excitons in quantum wells |
2000 |
Physica status solidi: A: applied research |
178 |
12 |
UA library record; WoS full record; WoS citing articles |
