| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Török, S.; Labar, J.; Schmeling, M.; Van Grieken, R. |
X-ray spectrometry |
1998 |
Analytical chemistry |
70 |
|
UA library record; WoS full record; WoS citing articles |
| van Cleempoel, A.; Joutsensaari, J.; Kauppinen, E.; Gijbels, R.; Claeys, M. |
Aerosol synthesis and characterization of ultrafine fullerene particles |
1998 |
Fullerene science and technology |
6 |
3 |
UA library record; WoS full record; WoS citing articles |
| Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. |
Characterization of MO derived nanostructured titania powders |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| van Landuyt, J.; Van Tendeloo, G. |
Charcaterization by high-resolution transmission electron microscopy |
1998 |
|
|
|
UA library record; WoS full record; |
| Peeters, F.M.; Partoens, B.; Schweigert, V.A.; Schweigert, I.V. |
Classical atomic bilayers |
1998 |
|
|
|
UA library record; WoS full record; |
| Schryvers, D.; Goessens, C.; van Renterghem, W.; van Landuyt, J.; de Keyzer, R. |
Conventional and HREM study of structural defects in nanostructured silver halides |
1998 |
|
|
|
UA library record |
| Oleshko, V.; Gijbels, R.; Jacob, W. |
Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides |
1998 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Gijbels, R.; Jacob, W.; van Daele, A. |
Cryo-electron spectroscopic imaging, electron energy-loss spectroscopy and energy-dispersive X-ray analysis of Ag(Br,I) nano- and microcrystals |
1998 |
Mikrochimica acta: supplementum |
15 |
|
UA library record; WoS full record; |
| Joutsensaari, J.; Kauppinen, E.I.; Bernaerts, D.; Van Tendeloo, G. |
Crystal growth studies during aerosol synthesis of nanostructured fullerene particles |
1998 |
Materials Research Society symposium proceedings |
520 |
1 |
UA library record; WoS full record; WoS citing articles |
| van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
Defect related growth of tabular AgCl(100) crystals: a TEM study |
1998 |
|
|
|
UA library record; WoS full record; |
| van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. |
Defects in AgCl and AgBr(100) tabular crystals studied by TEM |
1998 |
|
|
|
UA library record |
| Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
|
|
|
UA library record; WoS full record; |
| Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
|
|
|
UA library record |
| Maignan, A.; Martin, C.; Van Tendeloo, G.; Hervieu, M.; Raveau, B. |
Ferromagnetism and magnetoresistance in monolayered manganites Ca2-xLnxMnO4 |
1998 |
Journal of materials chemistry |
8 |
30 |
UA library record; WoS full record; WoS citing articles |
| Van Tendeloo, G.; Richard, O.; Schuddinck, W.; Hervieu, M. |
Fine structure of CMR perovskites by HREM and CBEM |
1998 |
Electron microscopy: vol. 1 |
|
|
UA library record; WoS full record; |
| Van Tendeloo, G. |
High resolution electron microscopy in materials research |
1998 |
Journal of materials chemistry |
8 |
8 |
UA library record; WoS full record; WoS citing articles |
| Yandouzi, M.; Toth, L.; Schryvers, D. |
High resolution transmission electron microscopy study of nanoscale Ni-rich Ni-Al films evaporated onto NaCl and KCl |
1998 |
Nanostructured materials |
10 |
2 |
UA library record; WoS full record; WoS citing articles |
| van Landuyt, J.; Van Tendeloo, G. |
HREM for characterisation of nanoscale microstructures |
1998 |
|
|
|
UA library record |
| Lebedev, O.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.U. |
HREM investigation of La(1-x)Ca(x)MnO3-delta thin films |
1998 |
|
|
|
UA library record; WoS full record; |
| Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.-U. |
HREM investigation of La1-xCaxMnO3- thin films |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Nistor, L.C.; van Landuyt, J.; Dincã, G. |
HREM of defects in cubic boron nitride single crystals |
1998 |
|
|
|
UA library record; WoS full record; |
| Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
|
|
|
UA library record |
| Vanwelkenhuysen, I.; Gijbels, R.; Geuens, I. |
Influence of the temperature on the morphology of silver behenate microcrystals |
1998 |
|
|
|
UA library record |
| Oleshko, V.; Schryvers, D.; Gijbels, R.; Jacob, W. |
Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM |
1998 |
|
|
|
UA library record |
| Rembeza, S.I.; Loginov, V.A.; Svistova, T.V.; Podkopaeva, O.I.; Rembeza, E.S.; van Landuyt, J. |
Laser thermotreatment of the SnO2layers |
1998 |
Eurosensors XII, vols 1 and 2 |
|
|
UA library record; WoS full record; |
| Nihoul, G.; Leroux, C.; Cesari, C.; Van Tendeloo, G. |
Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
|
UA library record |
| Seo, J.W.; Perret, J.; Fompeyrine, J.; Loquet, J.-P.; Van Tendeloo, G. |
Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Seo, J.W.; Perret, J.; Fompeyrine, J.; Van Tendeloo, G.; Loquet, J.-P. |
Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE |
1998 |
|
|
|
UA library record; WoS full record; |
| Verbist, K.; Tafuri, F.; Granozio, F.M.; Di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45 degrees twist grain boundaries in YBa2Cu3O7-delta |
1998 |
Electron Microscopy 1998, Vol 2: Materials Science 1 |
|
|
UA library record; WoS full record; |
