| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Schryvers, D.; Tirry, W.; Cao, S. |
Advanced TEM and SEM methods applied to 3D nano- and microstructural investigations of Ni4Ti3 precipitates in Ni-Ti (SMA) |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
|
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Tirry, W.; Yang, Z. |
Advanced TEM investigations on Ni-Ti shape memory material: strain and concentration gradients surrounding Ni4Ti3 precipitates |
2005 |
|
|
|
UA library record; WoS full record; |
| Schryvers, D. |
Advanced TEM studies of martensite and related phase transformations |
1999 |
|
|
|
UA library record; WoS full record; |
| Joutsensaari, J.; Ahonen, P.P.; Tapper, U.; Kauppinen, E.I.; Pauwels, B.; Amelinckx, S.; Van Tendeloo, G. |
Aerosol synthesis of nanostructured, ultrafine fullerene particles |
1999 |
|
|
|
UA library record |
| Shanenko, A.A.; Croitoru, M.D.; Mints, R.G.; Peeters, F.M. |
Andreev-type states induced by quantum confinement |
2008 |
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques |
2 |
1 |
UA library record; WoS full record; WoS citing articles |
| Hadermann, J.; Abakumov, A.M.; Van Tendeloo, G.; Shpanchenko, R.V.; Oleinikov, P.N.; Antipov, E.V. |
Anion ordering in fluorinated La2CuO4 |
1999 |
|
|
|
UA library record; WoS full record; |
| Fredrickx, P.; Wouters, J.; Schryvers, D. |
The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations |
2003 |
|
|
|
UA library record |
| Narayanan, V.; Lommens, P.; De Buysser, K.; Vanpoucke, D.E.P.; Huehne, R.; Molina, L.; Van Tendeloo, G.; van der Voort, P.; Van Driessche, I. |
Aqueous CSD approach for the growth of novel, lattice-tuned LaxCe1-xO\delta epitaxial layers |
2012 |
Journal of materials chemistry |
22 |
24 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S. |
Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld |
2011 |
Chemie magazine |
7 |
|
UA library record |
| Van Aert, S.; Batenburg, J.; Van Tendeloo, S. |
Atomen tellen |
2011 |
Nederlands tijdschrift voor natuurkunde (1991) |
77 |
|
UA library record |
| Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Verschoren, G.; Lievens, P.; Hou, M.; van Swygenhoven, H. |
Atomic scale characterization of supported and assembled nanoparticles |
2001 |
|
|
|
UA library record |
| Zhurkin, E.; Hou, M.; van Swygenhoven, H.; Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Lievens, P.; Verschoren, G.; Kuriplach, J.; van Peteghem, S.; Segers, D.; Dauwe, C. |
Atomic scale modeling of supported and assembled nanoparticles |
2001 |
|
|
|
UA library record |
| Van Tendeloo, G.; Schryvers, D. |
Atomic structure of alloys close to phase transitions |
2000 |
Nucleation and growth processes in materials |
580 |
|
UA library record; WoS full record; |
| Mahieu, S.; Ghekiere, P.; de Winter, G.; de Gryse, R.; Depla, D.; Lebedev, O.I. |
Biaxially aligned yttria stabilized zirconia and titanium nitride layers deposited by unbalanced magnetron sputtering |
2005 |
Diffusion and defect data : solid state data : part B : solid state phenomena
T2 – 2nd International Conference on Texture and Anisotropy of Polycrystals, JUL 07-09, 2004, Metz, FRANCE |
105 |
|
UA library record; WoS full record; WoS citing articles |
| Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. |
Calculation of Debye-Waller temperature factors for GaAs |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |
| Biró, L.P.; Khanh, N.Q.; Horváth, Z.E.; Vértesy, Z.; Kocsonya, A.; Konya, Z.; Osváth, Z.; Koós, A.; Guylai, J.; Zhang, X.B.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B. |
Catalyst traces after chemical purification in CVD grown carbon nanotubes |
2001 |
|
|
|
UA library record; WoS full record; WoS citing articles |
| Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
2001 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
| d' Hondt, H. |
Characterization of anion deficient perovskites |
2011 |
|
|
|
UA library record |
| Kirilenko, D. |
Characterization of graphene by electron diffraction |
2012 |
|
|
|
UA library record |
| Wiktor, C. |
Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy |
2014 |
|
|
|
UA library record |
| Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. |
Characterization of MO derived nanostructured titania powders |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
| Mortet, V.; Zhang, L.; Echert, M.; Soltani, A.; d' Haen, J.; Douheret, O.; Moreau, M.; Osswald, S.; Neyts, E.; Troadec, D.; Wagner, P.; Bogaerts, A.; Van Tendeloo, G.; Haenen, K. |
Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition |
2009 |
Materials Research Society symposium proceedings |
|
|
UA library record |
| Leroux, F. |
Characterization of soft-hard matter composite materials by advanced transmission electron microscopy |
2012 |
|
|
|
UA library record |
| van Landuyt, J.; Van Tendeloo, G. |
Charcaterization by high-resolution transmission electron microscopy |
1998 |
|
|
|
UA library record; WoS full record; |
| Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. |
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties |
2000 |
|
|
|
UA library record |
| De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
|
|
|
UA library record; WoS full record; |
| Vernochet, C.; Vannier, R.-N.; Huvé, M.; Pirovano, C.; Nowogrocki, G.; Mairesse, G.; Van Tendeloo, G. |
Chemical, structural and electrical characterizations in the BIZNVOX family |
2000 |
Journal of materials chemistry |
10 |
13 |
UA library record; WoS full record; WoS citing articles |
| Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation |
1999 |
Institute of physics conference series
T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND |
|
|
UA library record; WoS full record; |
| Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al. |
Comparative study of structural properties and photoluminescence in InGaN layers with a high In content |
2000 |
Internet journal of nitride semiconductor research
T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS |
5 |
|
UA library record; WoS full record; |
| Lubyshev, D.; Fastenau, J.M.; Fang, X.-M.; Wu, Y.; Doss, C.; Snyder, A.; Liu, W.K.; Lamb, M.S.M.; Bals, S.; Song, C. |
Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications |
2004 |
Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena |
22 |
25 |
UA library record; WoS full record; WoS citing articles |
