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“Glow discharges in emission and mass spectrometry”. Jakubowski N, Bogaerts A, Hoffmann V Blackwell, Sheffield (2003).
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“Hybrid magnetic-semiconductor nanostructures”. Peeters FM, de Boeck J Academic Press, New York, page 345 (1999).
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“Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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“Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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“Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J Kluwer Academic, s.l., page 63 (1997).
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“Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM”. Oleshko V, Schryvers D, Gijbels R, Jacob W s.l., page 293 (1998).
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“The junctionless nanowire transistor”. Sorée B, Pham A-T, Sels D, Magnus W Pan Stanford, S.l., page ? (2011).
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“Klinische semiologie en radiologie”. Parizel PM, Corthouts B, Snoeckx A, de Backer J, de Backer W Acco, Leuven, page 133 (2007).
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“Large bipolarons and high-Tc materials”. Devreese JT, Verbist G, Peeters FM Cambridge University Press, Cambridge, page 385 (1995).
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“Laser microprobe mass spectrometry: local surface analysis of organic and inorganic compounds”. van Vaeck L, van Roy W, Struyf H, Poels K, Gijbels R Vch, Weinheim, page 354 (1997).
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“Mass spectrometry, inorganic”. Adams F, Gijbels R, Jambers W, van Grieken R Wiley, Chichester, page 2650 (1998).
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“Metals and alloys”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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“Metals and alloys: 2: phase transformations”. Schryvers D, Van Tendeloo G Vch, Weinheim, page 80 (1997).
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“Microscopy of gemmological materials”. van Landuyt J, van Bockstael MHG, van Royen J Vch, Weinheim, page 293 (1997).
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“Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE”. Seo JW, Perret J, Fompeyrine J, Van Tendeloo G, Loquet J-P s.l., page 300 (1998).
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“Modeling network for argon glow discharge plasmas with copper cathode”. Bogaerts A, Gijbels R Nova, New York, page 1 (2002).
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“Modelling of radio frequency capacitively coupled plasma at intermediate pressures”. Berezhnoi S, Kaganovich I, Bogaerts A, Gijbels R Kluwer Academic, Dordrecht, page 525 (1999).
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“Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
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“Nanodesign of combined micro- and mesoporous materials for specific applications in adsorption and catalysis”. Meynen V, Busuioc AM, Beyers E, Cool P, Vansant EF, Bilba N, Mertens M, Lebedev O, Van Tendeloo G Nova, New York (2007).
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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
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“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2007).
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“Numerical modelling of analytical glow discharges”. Bogaerts A, Gijbels R Wiley, Chichester, page 155 (2003).
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“Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides”. Nikolaev AV, Michel KH, Copley JRD Plenum Press, New York, page 183 (1999).
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“The phase diagram”. Peeters FM Kluwer Academic Publishers, Dordrecht, page 17 (1997).
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“Photographic materials”. Verlinden G, Gijbels R, Geuens I Surface Spectra IM, Chichester, page 727 (2001).
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“Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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“Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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“Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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“Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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“Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
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