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Electron microscopical investigation of AgBr needle crystals”. Goessens C, Schryvers D, van Landuyt J, Millan A, de Keyzer R, Journal of crystal growth 151, 335 (1995). http://doi.org/10.1016/0022-0248(95)00080-1
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Characterization of nickel silicides using EELS-based methods”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of microscopy 240, 75 (2010). http://doi.org/10.1111/j.1365-2818.2010.03391.x
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Demonstration of lanthanum in liver cells by energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy and high-resolution transmission electron microscopy”. Yang Z, Schryvers D, Roels F, d' Haese PC, de Broe ME, Journal of microscopy 223, 133 (2006). http://doi.org/10.1111/j.1365-2818.2006.01601.x
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Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in NiTi”. Cao S, Tirry W, van den Broek W, Schryvers D, Journal of microscopy 233, 61 (2009). http://doi.org/10.1111/j.1365-2818.2008.03095.x
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Study of changes in L32 EELS ionisation edges upon formation of Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Journal of microscopy 210, 102 (2003). http://doi.org/10.1046/j.1365-2818.2003.01176.x
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TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre”. Ramachandran D, Egoavil R, Crabbe A, Hauffman T, Abakumov A, Verbeeck J, Vandendael I, Terryn H, Schryvers D, Journal of microscopy 264, 207 (2016). http://doi.org/10.1111/jmi.12434
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Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopy: INTERNAL ARCHITECTURE OF COFFIN-SHAPED”. Lu J, Bartholomeeusen E, Sels BF, Schryvers D, Journal of microscopy 265, 27 (2017). http://doi.org/10.1111/jmi.12459
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ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles”. Cautaerts N, Delville R, Schryvers D, Journal of microscopy 273, 189 (2019). http://doi.org/10.1111/jmi.12774
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Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy”. Lu J, Martinez GT, Van Aert S, Schryvers D, Physica status solidi: B: basic research 251, 2034 (2014). http://doi.org/10.1002/pssb.201350351
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Review on TEM analysis of growth twins in nanocrystalline palladium thin films : toward better understanding of twin-related mechanisms in high stacking fault energy metals”. Idrissi H, Amin-Ahmadi B, Wang B, Schryvers D, Physica status solidi: B: basic research 251, 1111 (2014). http://doi.org/10.1002/pssb.201350161
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Critical assessments and thermodynamic modeling of BaO-SiO2 and SiO2-TiO2 systems and their extensions into liquid immiscibility in the BaO-SiO2-TiO2 system”. Boulay E, Nakano J, Turner S, Idrissi H, Schryvers D, Godet S, Calphad computer coupling of phase diagrams and thermochemistry 47, 68 (2014). http://doi.org/10.1016/j.calphad.2014.06.004
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Structure refinement of L21 Cu-Zn-Al austenite, using dynamical electron diffraction data”. Satto S, Jansen J, Lexcellent C, Schryvers D, Solid state communications 116, 273 (2000). http://doi.org/10.1016/S0038-1098(00)00316-1
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Landscape roughness at an atomic scale”. Van Tendeloo G, De Meulenaere P, Schryvers D, Physica: D : nonlinear phenomena 107, 401 (1997). http://doi.org/10.1016/S0167-2789(97)00108-5
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TEM investigation of the formation mechanism of deformation twins in Fe-Mn-Si-Al TWIP steels”. Idrissi H, Renard K, Schryvers D, Jacques PJ, Philosophical magazine 93, 4378 (2013). http://doi.org/10.1080/14786435.2013.832837
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Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys”. Delville R, Kasinathan S, Zhang Z, van Humbeeck J, James RD, Schryvers D, Philosophical magazine 90, 177 (2010). http://doi.org/10.1080/14786430903074755
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A TEM study of nanoparticles in lustre glazes”. Fredrickx P, Helary D, Schryvers D, Darque-Ceretti E, Applied physics A : materials science &, processing 79, 283 (2004). http://doi.org/10.1007/s00339-004-2515-3
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The corrosion process of sterling silver exposed to a Na2S solution: monitoring and characterizing the complex surface evolution using a multi-analytical approach”. Schalm O, Crabbé, A, Storme P, Wiesinger R, Gambirasi A, Grieten E, Tack P, Bauters S, Kleber C, Favaro M, Schryvers D, Vincze L, Terryn H, Patelli A, Applied Physics A-Materials Science &, Processing 122, 903 (2016). http://doi.org/10.1007/s00339-016-0436-6
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EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
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Multiscale characterization of the work hardening mechanisms in Fe-Mn based TWIP steels”. Renard K, Idrissi H, Schryvers D, Jacques PJ, Steel research international 83, 385 (2012). http://doi.org/10.1002/srin.201100312
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Fabrication and characterization of functionally graded Ni-Ti multilayer thin films”. Tian H, Schryvers D, Mohanchandra KP, Carman GP, van Humbeeck J, Functional materials letters 2, 61 (2009). http://doi.org/10.1142/S1793604709000570
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Microstructure and functional property changes in thin Ni-Ti wires heat teated by electric current: high energy X-ray and TEM investigations”. Malard B, Pilch J, Sittner P, Gartnerova V, Delville R, Schryvers D, Curfs C, Functional materials letters 2, 45 (2009). http://doi.org/10.1142/S1793604709000557
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Ni cluster formation in low temperature annealed Ni50.6Ti49.4”. Pourbabak S, Wang X, Van Dyck D, Verlinden B, Schryvers D, Functional materials letters 10, 1740005 (2017). http://doi.org/10.1142/S1793604717400057
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Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
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Evaluation of top, angle, and side cleaned FIB samples for TEM analysis”. Montoya E, Bals S, Rossell MD, Schryvers D, Van Tendeloo G, Microscopy research and technique 70, 1060 (2007). http://doi.org/10.1002/jemt.20514
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Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite”. Zelaya E, Schryvers D, Microscopy research and technique 74, 84 (2011). http://doi.org/10.1002/jemt.20877
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Transmission electron microscopy studies of (111) twinned silver halide microcrystals”. Goessens C, Schryvers D, van Landuyt J, Microscopy research and technique 42, 85 (1998). http://doi.org/10.1002/(SICI)1097-0029(19980715)42:2<85::AID-JEMT3>3.0.CO;2-M
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Nanohardness and structure of nitrogen implanted SixAly coatings post-implanted with oxygen”. Jacobs M, Bodart F, Terwagne G, Schryvers D, Poulet A, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 147, 231 (1999). http://doi.org/10.1016/S0168-583X(98)00535-7
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Dedicated TEM on domain boundaries from phase transformations and crystal growth”. Schryvers D, Van Aert S, Delville R, Idrissi H, Turner S, Salje EKH, Phase transitions 86, 15 (2013). http://doi.org/10.1080/01411594.2012.694435
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Functional twin boundaries”. Van Aert S, Turner S, Delville R, Schryvers D, Van Tendeloo G, Ding X, Salje EKH, Phase transitions 86, 1052 (2013). http://doi.org/10.1080/01411594.2012.748909
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Epitaxial Ni-Al thin films on NaCl using a Ag buffer layer”. Yandouzi M, Toth L, Vasudevan V, Cannaerts M, van Haesendonck C, Schryvers D, Philosophical magazine letters 80, 719 (2000). http://doi.org/10.1080/09500830050192936
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