Jones, K.W.; Feng, H.; Lindquist, W.B.; Adler, P.M.; Thover, J.F.; Vekemans, B.; Vincze, L.; Szalóki, I.; Van Grieken, R.; Adams, F.; Riekel, C. |
Study of microgeometry of porous materials using synchrotron computed microtomography |
2003 |
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UA library record |