Number of records found: 216
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Citations
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Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000).
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Analysis of nonconducting materials by dc glow discharge spectrometry”. Bogaerts A, Schelles W, van Grieken R Wiley, Chichester, page 293 (2003).
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The application of transmission electron microscopy (TEM) in the research of inorganic colorants in stained glass windows and parchment illustrations”. Fredrickx P, Wouters J, Schryvers D Archetype, London, page 137 (2003).
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Charcaterization by high-resolution transmission electron microscopy”. van Landuyt J, Van Tendeloo G Stt, Den Haag, page 187 (1998).
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Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
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Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides”. Oleshko V, Gijbels R, Jacob W Spie, Washington, D.C., page 326 (1998).
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The crystal structure of YSr2Cu3O6+x determined by HREM”. Lebedev O, Van Tendeloo G, Marezio M, Licci F, Gilioli E, Gauzzi A, Prodi A s.l., page 877 (2002).
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Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
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Electron diffraction and microscopy of single-walled carbon nanotube bundles”. Colomer J-F, Van Tendeloo G Kluwer, Boston, Mass., page 45 (2003).
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Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
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Evolution of impurity clusters and mechanism of formation of photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV Antwerp, page 275 (1998).
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Functional imaging to predict treatment success of mandibular advancement devices in sleep-disordered breathing”. de Backer J, Vanderveken O, Vos W, Devolder A, Verhulst S, Verbraecken J Antwerpen, page 141 (2008).
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Glow discharge mass spectrometry, methods”. Bogaerts A Academic Press, San Diego, Calif., page 669 (2000).
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Glow discharges in emission and mass spectrometry”. Jakubowski N, Bogaerts A, Hoffmann V Blackwell, Sheffield (2003).
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Hybrid magnetic-semiconductor nanostructures”. Peeters FM, de Boeck J Academic Press, New York, page 345 (1999).
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Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J Kluwer Academic, s.l., page 63 (1997).
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Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM”. Oleshko V, Schryvers D, Gijbels R, Jacob W s.l., page 293 (1998).
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The junctionless nanowire transistor”. Sorée B, Pham A-T, Sels D, Magnus W Pan Stanford, S.l., page ? (2011).
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Klinische semiologie en radiologie”. Parizel PM, Corthouts B, Snoeckx A, de Backer J, de Backer W Acco, Leuven, page 133 (2007).
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Large bipolarons and high-Tc materials”. Devreese JT, Verbist G, Peeters FM Cambridge University Press, Cambridge, page 385 (1995).
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Laser microprobe mass spectrometry: local surface analysis of organic and inorganic compounds”. van Vaeck L, van Roy W, Struyf H, Poels K, Gijbels R Vch, Weinheim, page 354 (1997).
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Mass spectrometry, inorganic”. Adams F, Gijbels R, Jambers W, van Grieken R Wiley, Chichester, page 2650 (1998).
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Metals and alloys”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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Metals and alloys: 2: phase transformations”. Schryvers D, Van Tendeloo G Vch, Weinheim, page 80 (1997).
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Microscopy of gemmological materials”. van Landuyt J, van Bockstael MHG, van Royen J Vch, Weinheim, page 293 (1997).
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Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE”. Seo JW, Perret J, Fompeyrine J, Van Tendeloo G, Loquet J-P s.l., page 300 (1998).
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Modeling network for argon glow discharge plasmas with copper cathode”. Bogaerts A, Gijbels R Nova, New York, page 1 (2002).
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