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“
A flexible and accurate quantification algorithm for EPXMA based on thin-film element yields
”. Schalm O, Janssens K, Spectrochimica acta: part B : atomic spectroscopy
58
, 669 (2003). http://doi.org/10.1016/S0584-8547(02)00290-2
Keywords:
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor:
3.241
DOI:
10.1016/S0584-8547(02)00290-2
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