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“Multiply twinned phases and microstructures in Ni-Al: a transmission electron microscopy study”. Schryvers D s.l., page 143 (1991).
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“Investigation of individual particles and gaseous air pollutants in showcases”. Godoi RHM, Kontozova V, Godoi AFL, Van Grieken R page 147 (2004).
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“X-ray fluorescence”. Injuk J, Van Grieken RE page 151 (2001).
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“X-ray spectrometry for analysis of atmospheric particulate matter: detection limits versus legal levels”. Van Grieken R, Makarovska Y, van Meel K, Worobiec A page 153 (2007).
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“Numerical modelling of analytical glow discharges”. Bogaerts A, Gijbels R Wiley, Chichester, page 155 (2003).
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“Evaluation and calibration of micro-XRF data”. Janssens K, Vincze L, Vekemans B page 155 (2000).
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“Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
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“Energy-dispersive X-ray fluorescence for direct trace analysis of biomedical and environmental samples”. Van Grieken R, Robberecht H, Shani J, Van Dyck P, Vos L page 159 (1982).
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“Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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“Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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“Analytical methods to study atmospheric pollution and weathering of materials”. Van Grieken R, Cardell C, Delalieux F, Eyckmans K page 163 (2001).
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“Analysis of façon-de-Venise glass originating from Central and Western Europe”. Šmit Ž, Janssens K, Schalm O, Kos M page 165 (2005).
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“A chemical investigation of altered Chinese jade art objects”. Aerts A, Janssens K, Adams F page 170 (1997).
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“Caracterização dos sistemas iônicos e particulado no reservatório”. Godoi RHM, Bittencourt AVL, Hirata PY, Jafelicci Junior M, dos Reis Neto JM, de Souza Sarkis JE, Zara LF, Van Grieken R page 170 (2011).
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“Effects of marine spray and air pollution on monuments in the Mediterranean coastal environment”. Torfs K, Van Grieken R page 170 (1996).
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“Magneto-polaron effect on shallow donors in 3D en Q2S systems”. Devreese JT, Shi JM, Peeters FM Kluwer, Dordrecht, page 173 (1993).
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“Analytical electron microscopy of single particles”. Markowicz A, Raeymaekers B, Van Grieken R, Adams F page 173 (1986).
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“Determination of ultra-trace levels of palladium in environenmental samples by graphite furnace atomic spectrometry techniques”. Bencs L, Ravindra K, Van Grieken R page 173 (2006).
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“Structural heterogeneity within airborne particles”. Injuk J, de Bock L, Van Grieken R page 173 (1998).
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“Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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“Structural characterization of organic molecules by laser mass spectrometry”. van Vaeck L, van Roy W, Gijbels R, Adams F Wiley, New York, page 177 (1993).
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“Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
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“Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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“Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides”. Nikolaev AV, Michel KH, Copley JRD Plenum Press, New York, page 183 (1999).
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“X-ray microanalysis: a new tool for environmental analysis”. Adams F, Janssens K page 183 (1996).
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“Fluxes and sources of heavy metal inputs into the Southern Bight of the North Sea”. Van Grieken R, Injuk J, Otten P, Rojas C, van Malderen H, Laane R page 184 (1992).
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“Charcaterization by high-resolution transmission electron microscopy”. van Landuyt J, Van Tendeloo G Stt, Den Haag, page 187 (1998).
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“Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
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“Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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“Electron microscopy of interfaces in new materials”. Van Tendeloo G, Goessens C, Schryvers D, van Haverbergh J, de Veirman A, van Landuyt J s.l., page 200 (1991).
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