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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Geuens, I.; Gijbels, R.; Dekeyzer, R.; Verbeeck, A. |
Micro and surface analysis of individual silver halide microcrystals using a scanning ion microprobe |
1994 |
Papers |
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UA library record; WoS full record; |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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|
UA library record |
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Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. |
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1997 |
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UA library record; WoS full record; |
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