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2θ-resolution obtainable during – XRPD experiments at Beamline L”. de Nolf W, Jaroszewicz J, Janssens K, Falkenberg G page 1655 (2008).
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Mass spectrometry, inorganic”. Adams F, Gijbels R, Jambers W, van Grieken R Wiley, Chichester, page 2650 (1998).
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Atomic mass spectrometry”. Gijbels R, Oksenoid KG Academic Press, London, page 2839 (1995).
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Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
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X-ray spectrometry”. Van Grieken RE page 13269 (2000).
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Sample preparation for X-ray fluorescence analysis”. Injuk J, Van Grieken R page 13338 (2000).
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