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Carbon and nitrogen 1s energy levels in amorphous carbon nitride systems: XPS interpretation using first-principles”. Titantah JT, Lamoen D, Diamond And Related Materials 16, 581 (2007). http://doi.org/10.1016/j.diamond.2006.11.048
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Evidence for anionic redox activity in a tridimensional-ordered Li-rich positive electrode β-Li2IrO3”. Pearce PE, Perez AJ, Rousse G, Saubanère M, Batuk D, Foix D, McCalla E, Abakumov AM, Van Tendeloo G, Doublet M-L, Tarascon J-M, Nature materials 16, 580 (2017). http://doi.org/10.1038/nmat4864
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Development of a ReaxFF reactive force field for intrinsic point defects in titanium dioxide”. Huygh S, Bogaerts A, van Duin ACT, Neyts EC, Computational materials science 95, 579 (2014). http://doi.org/10.1016/j.commatsci.2014.07.056
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Locating and controlling the Zn content in In(Zn)P quantum dots”. Kirkwood N, De Backer A, Altantzis T, Winckelmans N, Longo A, Antolinez FV, Rabouw FT, De Trizio L, Geuchies JJ, Mulder JT, Renaud N, Bals S, Manna L, Houtepen AJ, Chemistry of materials 32, 557 (2019). http://doi.org/10.1021/acs.chemmater.9b04407
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Electronically coupled complementary interfaces between perovskite band insulators”. Huijben M, Rijnders G, Blank DHA, Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Brinkman A, Hilgenkamp H, Nature materials 5, 556 (2006). http://doi.org/10.1038/nmat1675
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Characterization of impact materials around Barringer meteor crater by micro-PIXE nd micro-SRXRF techniques”. Uzonyi I, Szöör G, Rozsa P, Vekemans B, Vincze L, Adams F, Drakopoulos M, Somogyi A, Kiss ÁZ, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 219/220, 555 (2004). http://doi.org/10.1016/J.NIMB.2004.01.119
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End-to-end assembly of shape-controlled nanocrystals via a nanowelding approach mediated by gold domains”. Figuerola A, Franchini IR, Fiore A, Mastria R, Falqui A, Bertoni G, Bals S, Van Tendeloo G, Kudera S, Cingolani R, Manna L, Advanced materials 21, 550 (2009). http://doi.org/10.1002/adma.200801928
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Comparative analysis of the low-energy He+ ions scattering on Al and Al2O3 surfaces”. Fomin VM, Misko VR, Devreese JT, Brongersma HH, Nuclear Instruments &, Methods In Physics Research Section B-Beam Interactions With Materials And Atoms 145, 545 (1998). http://doi.org/10.1016/S0168-583X(98)00530-8
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The effect of surface defects on the vortex expulsion and penetration in mesoscopic superconducting disks”. Baelus BJ, Peeters FM, Physica: C : superconductivity T2 –, 7th International Conference on Materials and Mechanisms of, Superconductive and High Temperature Superconductors, MAY 25-30, 2003, Rio de Janeiro, BRAZIL 408, 543 (2004). http://doi.org/10.1016/j.physc.2004.03.206
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Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering”. Hendrich C, Favre L, Ievlev DN, Dobrynin AN, Bras W, Hörmann U, Piscopiello E, Van Tendeloo G, Lievens P, Temst K, Applied physics A : materials science &, processing 86, 533 (2007). http://doi.org/10.1007/s00339-006-3808-5
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Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy”. Van Aert S, Turner S, Delville R, Schryvers D, Van Tendeloo G, Salje EKH, Advanced materials 24, 523 (2012). http://doi.org/10.1002/adma.201103717
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Electron-microscopy and the structural studies of superconducting materials and fullerites”. Van Tendeloo G, Amelinckx S, NATO Advanced Study Institutes series: series E : applied sciences T2 –, NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy , 521 (1994)
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Growth mechanism of epitaxial SrTiO3 on a (1 x 2) + (2 x 1) reconstructed Sr(1/2 ML)/Si(001) surface”. Spreitzer M, Klement D, Egoavil R, Verbeeck J, Kovac J, Zaloznik A, Koster G, Van Tendeloo G, Suvorov D, Rijnders G, Journal Of Materials Chemistry C 8, 518 (2020). http://doi.org/10.1039/C9TC04092G
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Quantitative determination of the crystal structure of Ni4Ti3 precipitates”. Tirry W, Schryvers D, Jorissen K, Lamoen D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 438, 517 (2006). http://doi.org/10.1016/j.msea.2006.02.063
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Dynamics of nanoclustering in Te+ implanted Si after application of high frequency electromagnetic field and thermal annealing”. Kalitzova M, Lebedev OI, Zollo G, Gesheva K, Vlakhov E, Marinov Y, Ivanova T;, Applied physics A : materials science &, processing 91, 515 (2008). http://doi.org/10.1007/s00339-008-4441-2
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Properties and thermal stability of solution processed ultrathin, high-k bismuth titanate (Bi2Ti2O7) films”. Hardy A, Van Elshocht S, De Dobbelaere C, Hadermann J, Pourtois G, De Gendt S, Afanas'ev VV, Van Bael MK, Materials research bulletin 47, 511 (2012). http://doi.org/10.1016/j.materresbull.2012.01.001
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Nucleation and growth of Ni5Al3 in austenite and martensite matrices”. Schryvers D, Ma Y, Toth L, Tanner LE, Electron Microscopy 1994, Vols 2a And 2b: Applications In Materials Sciences , 509 (1994)
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MnFe0.5Ru0.5O3 : an above-room-temperature antiferromagnetic semiconductor”. Tan X, McCabe EE, Orlandi F, Manuel P, Batuk M, Hadermann J, Deng Z, Jin C, Nowik I, Herber R, Segre CU, Liu S, Croft M, Kang C-J, Lapidus S, Frank CE, Padmanabhan H, Gopalan V, Wu M, Li M-R, Kotliar G, Walker D, Greenblatt M, Journal of materials chemistry C : materials for optical and electronic devices 7, 509 (2019). http://doi.org/10.1039/C8TC05059G
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Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Institute of physics conference series T2 –, Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND , 495 (1999)
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Structural transformation in fluorinated LaACuGaO5 (A=Ca, Sr) brownmillerites”. Hadermann J, Van Tendeloo G, Abakumov AM, Pavlyuk BP, Rozova MG, Antipov EV, International journal of inorganic materials 2, 493 (2000). http://doi.org/10.1016/S1466-6049(00)00072-6
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Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Fullerenes and carbon based materials , 487 (1998)
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Stabilization of mercury-based superconductors by foreign cations”. Raveau B, Michel C, Hervieu M, Van Tendeloo G, Maignan A, Annales de chimie (1914) T2 –, 4th North-African Materials Science Symposium (JMSM 94), NOV 23-24, 1994, CASABLANCA, MOROCCO 19, 487 (1994)
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Measuring strain fields and concentration gradients around Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang ZQ;, Materials science and engineering A: structural materials properties microstructure and processing 438, 485 (2006). http://doi.org/10.1016/j.msea.2006.02.166
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Structure solution and refinement of metal-ion battery cathode materials using electron diffraction tomography”. Hadermann J, Abakumov AM, And Materials 75, 485 (2019). http://doi.org/10.1107/S2052520619008291
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Cross-section transmission electron microscopy characterization of the near-surface structure of medical Nitinol superelastic tubing”. Potapov PL, Tirry W, Schryvers D, Sivel VGM, Wu M-Y, Aslanidis D, Zandbergen H, Journal of materials science: materials in medicine 18, 483 (2007). http://doi.org/10.1007/s10856-007-2008-y
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Selective Plasma Oxidation of Ultrasmall Si Nanowires”. Khalilov U, Yusupov M, Bogaerts A, Neyts EC, The journal of physical chemistry: C : nanomaterials and interfaces 120, 472 (2016). http://doi.org/10.1021/acs.jpcc.5b11027
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Tuning of energy levels in a superlattice”. Peeters FM, Materials Research Society symposium proceedings 325, 471 (1994)
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The influence of surface oxides on the distribution and release of nickel from Nitinol wires”. Shabalovskaya SA, Tian H, Anderegg JW, Schryvers DU, Carroll WU, van Humbeeck J, Biomaterials 30, 468 (2009). http://doi.org/10.1016/j.biomaterials.2008.10.014
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Introducton to the special issue on electron crystallography”. Hadermann J, Palatinus L, And Materials 75, 462 (2019). http://doi.org/10.1107/S2052520619010783
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Interface-induced modulation of charge and polarization in thin film Fe3O4”. Tian H, Verbeeck J, Brück S, Paul M, Kufer D, Sing M, Claessen R, Van Tendeloo G, Advanced materials 26, 461 (2014). http://doi.org/10.1002/adma.201303329
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