Number of records found: 139
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Citations
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Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness”. Van Dyck PM, Van Grieken RE, Analytical chemistry 52, 1859 (1980). http://doi.org/10.1021/AC50062A020
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Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles”. Tsuji K, Takenaka H, Wagatsuma K, de Bokx PK, Van Grieken RE, Spectrochimica acta: part B : atomic spectroscopy 54, 1881 (1999). http://doi.org/10.1016/S0584-8547(99)00143-3
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Background aerosol composition in the Namib Desert, South West-Africa (Namibia)”. Annegarn HJ, Van Grieken RE, Dibby DM, Von Blottnitz F, Atmospheric environment : an international journal 17, 2045 (1983). http://doi.org/10.1016/0004-6981(83)90361-X
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Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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Fractal dimensional classification of aerosol particles by computer-controlled scanning electron microscopy”. Kindratenko VV, van Espen PJM, Treiger BA, Van Grieken RE, Environmental science and technology 28, 2197 (1994). http://doi.org/10.1021/ES00061A031
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Discrimination between coprecipitated and adsorbed lead on individual calcite particles using laser microprobe mass analysis”. Wouters LC, Van Grieken RE, Linton RW, Bauer CF, Analytical chemistry 60, 2218 (1988). http://doi.org/10.1021/AC00171A011
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Classification of suspended particles in deposition samples and run-off water samples from a limestone cathedral”. Leysen LA, Roekens EJ, Storms H, Van Grieken RE, Atmospheric environment 21, 2425 (1987). http://doi.org/10.1016/0004-6981(87)90377-5
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Grazing exit electron probe microanalysis for surface and particle analysis”. Tsuji K, Wagatsuma K, Nullens R, Van Grieken RE, Analytical chemistry 71, 2497 (1999). http://doi.org/10.1021/AC990075P
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Use of stable isotope measurements to evaluate the origin of suphur in gypsum layers on limestone buildings”. Torfs KM, Van Grieken RE, Buzek F, Environmental science and technology 31, 2650 (1997)
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A case study of ships forming and not forming tracks in moderately polluted clouds”. Noone KJ, Öström E, Ferek RJ, Garrett T, Hobbs PV, Johnson DW, Taylor JP, Russell LM, Flagan RC, Seinfeld JH, O'Dowd CD, Smith MH, Durkee PA, Nielsen K, Hudson JG, Pockalny RA, de Bock L, Van Grieken RE, Gasparovic RF, Brooks I, Journal of the atmospheric sciences 57, 2729 (2000). http://doi.org/10.1175/1520-0469(2000)057<2729:ACSOSF>2.0.CO;2
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A case study of ship track formation in a polluted marine boundary layer”. Noone KJ, Johnson DW, Taylor JP, Ferek RJ, Garrett T, Hobbs PV, Durkee PA, Nielsen K, Öström E, O'Dowd CD, Smith MH, Russell LM, Flagan RC, Seinfeld JH, de Bock L, Van Grieken RE, Hudson JG, Brooks I, Gasparovic RF, Pockalny RA, Journal of the atmospheric sciences 57, 2748 (2000). http://doi.org/10.1175/1520-0469(2000)057<2748:ACSOST>2.0.CO;2
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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Micro-analysis of museum aerosols to elucidate the soiling of paintings: case of the Correr Museum, Venice, Italy”. de Bock LA, Van Grieken RE, Camuffo D, Grime GW, Environmental science and technology 30, 3341 (1996). http://doi.org/10.1021/ES9602004
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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Grazing-exit particle-induced X-ray emission analysis with extremely low background”. Tsuji K, Spolnik Z, Wagatsuma K, Van Grieken RE, Vis RD, Analytical chemistry 71, 5033 (1999). http://doi.org/10.1021/AC990568U
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X-ray spectrometry”. Van Grieken RE page 13269 (2000).
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