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Author
Title
Year
Publication
Volume
Times cited
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Oleshko, V.
;
Gijbels, R.
;
Jacob, W.
;
Alfimov, M.
Characterization of complex silver halide photographic systems by means of analytical electron microscopy
1995
Microbeam analysis
4
9
UA library record
;
WoS full record
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WoS citing articles