Number of records found: 159
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Citations
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Radioactive particle characterisation by means of synchrotron radiation-based X-ray micro beam techniques”. Lind OC, Salbu B, Janssens K, Simionovici AS, (2002)
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SR-based X-ray microbeam techniques utilised for solid-state speciation of U in fuel particles”. Salbu B, Janssens K, Lind OC, Simionovici AS, Trekling T, Drakopoulos M, Snigireva I, Snigirev A, (2002)
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Atmospheric aerosol particles: a review on sources, sinks and effects”. Hoornaert S, Van Grieken R, (2002)
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Characterisation of air pollutants in museum showcases”. Kontozova V, Deutsch F, Godoi R, Godoi AF, Joos P, Van Grieken R, (2002)
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Microstructural criteria for the evaluation of stone susceptibility to sea-salt decay”. Moropoulou A, Koui M, Theoulakis P, Bakolas A, Roumpopoulos K, Michailidis P, Van Grieken R, Cardell-Fernandez C, (2002)
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Sub-minute determination of BTEX in environmental samples using low pressure GC-ITMS”. Joos PE, Godoi AFL, de Jong R, de Zeeuw J, Van Grieken R, (2002)
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Modeling network for argon glow discharge plasmas with copper cathode”. Bogaerts A, Gijbels R Nova, New York, page 1 (2002).
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Catalyst traces and other impurities in chemically purified carbon nanotubes grown by CVD”. Biró, LP, Khanh NQ, Vértesy Z, Horváth ZE, Osváth Z, Koós A, Gyulai J, Kocsonya A, Kónya Z, Zhang XB, Van Tendeloo G, Fonseca A, Nagy JB;, Materials science and engineering: part C: biomimetic materials T2 –, EMRS Spring Meeting, JUN 05-08, 2001, STRASBOURG, FRANCE 19, 9 (2002). http://doi.org/10.1016/S0928-4931(01)00407-6
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Applying digital image processing to SEM-EDX and BSE images to determine and quantify porosity and salts with depth in porous media”. Cardell C, Yebra A, Van Grieken RE, Microchimica acta 140, 9 (2002). http://doi.org/10.1007/S006040200063
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Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B, Journal of alloys and compounds 333, 13 (2002). http://doi.org/10.1016/S0925-8388(01)01691-7
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Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis”. Ro C-U, Hoornaert S, Van Grieken R page 17 (2002).
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Synthesis and investigation of novel Mn-based oxyfluoride Sr2Mn2O5-xF1+x”. Lobanov MV, Abakumov AM, Sidorova AV, Rozova MG, D'yachenko OG, Antipov EV, Hadermann J, Van Tendeloo G, Solid state sciences 4, 19 (2002). http://doi.org/10.1016/S1293-2558(01)01209-2
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High-resolution electron microscopy and electron tomography: resolution versus precision”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A, Journal of structural biology 138, 21 (2002). http://doi.org/10.1016/S1047-8477(02)00016-3
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The ion- and atom-induced secondary electron emission yield: numerical study for the effect of clean and dirty cathode surfaces”. Bogaerts A, Gijbels R, Plasma sources science and technology 11, 27 (2002). http://doi.org/10.1088/0963-0252/11/1/303
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Artificial atoms and molecules”. Partoens B, Peeters FM, Physicalia magazine 24, 29 (2002)
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HREM study of compounds in the Bi-rich part of the Ba-Bi-O system”. Nikolaichik VI, Amelinckx S, Klinkova LA, Barkovskii NV, Lebedev OI, Van Tendeloo G, Journal of solid state chemistry 163, 44 (2002). http://doi.org/10.1006/jssc.2001.9362
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Correlation energy and configuration of biexcitons in quantum wells”. Riva C, Peeters FM, Varga K, Schweigert VA, Physica status solidi: B: basic research 234, 50 (2002). http://doi.org/10.1002/1521-3951(200211)234:1<50::AID-PSSB50>3.0.CO;2-R
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Can plasma spectrochemistry assist in improving the accuracy of chemical analysis?”.Adams F, Adriaens A, Bogaerts A, Analytica chimica acta 456, 63 (2002). http://doi.org/10.1016/S0003-2670(02)00010-7
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Damage functions and mechanism equations derived from limestone weathering in field exposure”. Delalieux F, Cardell-Fernandez C, Torfs K, Vleugels G, Van Grieken RE, Water, air and soil pollution 139, 75 (2002). http://doi.org/10.1023/A:1015827031669
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Observation of Sb203 nanocrystals in SiO2 after Sb ion implantation”. Ignatova VA, Lebedev OI, Wätjen U, van Vaeck L, van Landuyt J, Gijbels R, Adams F, Microchimica acta 139, 77 (2002). http://doi.org/10.1007/s006040200043
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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On the distinction between 16th and 17th century Venetian glass and façon-de-Venise glass”. de Raedt I, Janssens K, Veeckman J page 95 (2002).
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ID18F: a new X-ray microprobe end station”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, ESRF highlights 2001 , 96 (2002)
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Trions in quantum wells”. Peeters FM, Riva C, Varga K, Few-body systems T2 –, International Workshop on Dynamics and Structure of Critically Stable, Quantum Few-Body Systems, OCT 08-12, 2001, LES HOUCHES, FRANCE 31, 97 (2002). http://doi.org/10.1007/s006010200005
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Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry”. Bogaerts A, Wilken L, Hoffmann V, Gijbels R, Wetzig K, Spectrochimica acta: part B : atomic spectroscopy 57, 109 (2002). http://doi.org/10.1016/S0584-8547(01)00357-3
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Electron diffraction and microscopy of single-wall carbon nanotube bundles produced by different methods”. Colomer J-F, Henrard L, Lambin P, Van Tendeloo G, European physical journal : B : condensed matter and complex systems 27, 111 (2002). http://doi.org/10.1140/epjb/e20020135
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Application of thin-window EPMA to environmental problems in Hungary”. Osán J, Kurunczi S, Török S, Worobiec A, Van Grieken R, Microchimica acta 139, 111 (2002). http://doi.org/10.1007/S006040200048
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Reliability of copper dual damascene influenced by pre-clean”. Tokei Z, Lanckmans F, van den Bosch G, Van Hove M, Maex K, Bender H, Hens S, van Landuyt J, Analysis Of Integrated Circuits , 118 (2002). http://doi.org/10.1109/IPFA.2002.1025629
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Modelling of a dielectric barrier glow discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Gijbels R, Vangeneugden D, , 130 (2002)
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