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Author | Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. | ||||
Title | Image-quality evaluation and model selection with maximum a posteriori probability | Type | H2 Book chapter | ||
Year | 2021 | Publication | Advances in imaging and electron physics T2 – Advances in imaging and electron physics | Abbreviated Journal | |
Volume | Issue | Pages ![]() |
215-242 | ||
Keywords | H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The maximum a posteriori (MAP) probability rule for atom column detection can also be used as a tool to evaluate the relation between scanning transmission electron microscopy (STEM) image quality and atom detectability. In this chapter, a new image-quality measure is proposed that correlates well with atom detectability, namely the integrated contrast-to-noise ratio (ICNR). Furthermore, the working principle of the MAP probability rule is described in detail showing a close relation to the principles of model-selection methods. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | 2021-03-06 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | 217 | Series Issue | Edition | ||
ISSN | ISBN | 978-0-12-824607-8; 1076-5670 | Additional Links | UA library record | |
Impact Factor | Times cited | Open Access | Not_Open_Access | ||
Notes | ERC Consolidator project funded by the European Union grant #770887 Picometrics | Approved | Most recent IF: NA | ||
Call Number | UA @ admin @ c:irua:177532 | Serial | 6782 | ||
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