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| Record | |||||
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| Author | Oleshko, V.P.; Gijbels, R.; Jacob, W. | ||||
| Title | Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques | Type | P3 Proceeding | ||
| Year | 1996 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages  |
46-50 | ||
| Keywords | P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Minneapolis, Minn. | Editor | ||
| Language | Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:16245 | Serial | 400 | ||
| Permanent link to this record | |||||