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Author | Mahieu, S.; Ghekiere, P.; de Winter, G.; Heirwegh, S.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. | ||||
Title | Mechanism of preferential orientation in sputter deposited titanium nitride and yttria-stabilized zirconia layers | Type | A1 Journal article | ||
Year | 2005 | Publication | Journal of crystal growth | Abbreviated Journal | J Cryst Growth |
Volume | 279 | Issue | Pages | 100-109 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000229348400015 | Publication Date | 2005-03-19 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0022-0248; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.751 | Times cited | 41 | Open Access | |
Notes | Approved | Most recent IF: 1.751; 2005 IF: 1.681 | |||
Call Number | UA @ lucian @ c:irua:54788 | Serial | 1979 | ||
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