| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| van Roy, W.; van Vaeck, L.; Gijbels, R. |
Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis |
1992 |
|
|
|
UA library record |
| Cao, S.; Nishida, M.; Somsen, C.; Eggeler, G.; Schryvers, D. |
3D FIB/SEM study of Ni4Ti3 precipitates in Ni-Ti alloys with different thermal-mechanical histories |
2009 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
| Delville, R.; James, R.D.; Salman, U.; Finel, A.; Schryvers, D. |
Transmission electron microscopy study of low-hysteresis shape memory alloys |
2009 |
|
|
3 |
UA library record; WoS full record; WoS citing articles |
| Idrissi, H.; Schryvers, D.; Salje, E.K.H.; Zhang, H.; Carpenter, M.A.; Moya, X. |
Pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79 |
2009 |
|
|
2 |
UA library record; WoS full record; WoS citing articles |
| Tirry, W.; Schryvers, D. |
3D strain fields surrounding Ni4Ti3: direct measurement and correlation with the R-phase |
2009 |
|
|
|
UA library record; WoS full record |
| Koenraad, P.M.; Shi, J.M.; van de Stadt, A.F.W.; Smets, A.; Perenboom, J.A.A.J.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in a δ-doped quantum barrier |
1996 |
|
|
|
UA library record |
| Shi, J.M.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in Si ?-doped GaAs |
1996 |
|
|
|
UA library record |
| Shi, J.M.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Effects of DX centers on electronic structure of a ?-doped quantum barrier |
1996 |
|
|
|
UA library record |
| Shi, J.M.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Effects of the DX centers on electronic structure of a δ-doped quantum barrier |
1996 |
|
|
|
UA library record |
| Goldoni, G.; Peeters, F.M. |
Melting of a quantum Wigner crystal in bi-layer structures |
1996 |
|
|
|
UA library record |
| Adriaens, A.; van Nevel, L.; Van 't dack, L.; de Bièvre, P.; Adams, F.; Gijbels, R. |
The use of surface analysis techniques and isotope mass spectrometry for the study of water-rock interactions of interest in hot-dry rock technology |
1995 |
|
|
|
UA library record |
| Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
|
UA library record |
| Marmorkos, I.K.; Schweigert, V.A.; Peeters, F.M.; Lok, J.G.S. |
Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices |
1996 |
|
|
|
UA library record |
| Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
|
|
|
UA library record |
| Geim, A.K.; Lok, J.G.S.; Maan, J.C.; Dubonos, S.V.; Li, X.Q.; Peeters, F.M.; Nazarov, Y.V. |
Precision magnetometry on a submicron scale |
1996 |
|
|
|
UA library record |
| Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. |
TEM study of the mechanism of Ni ion release from Nitinol wires with original oxides |
2009 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
| Van Grieken, R.E. |
X-ray spectrometry |
2000 |
|
15 |
|
UA library record |
| Injuk, J.; Van Grieken, R. |
Sample preparation for X-ray fluorescence analysis |
2000 |
|
15 |
|
UA library record |
| Groenendijk, D.J.; Autieri, C.; van Thiel, T.C.; Brzezicki, W.; Hortensius, J.R.; Afanasiev, D.; Gauquelin, N.; Barone, P.; van den Bos, K.H.W.; van Aert, S.; Verbeeck, J.; Filippetti, A.; Picozzi, S.; Cuoco, M.; Caviglia, A.D. |
Berry phase engineering at oxide interfaces |
2020 |
|
2 |
58 |
UA library record; WoS full record; WoS citing articles |
