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Micro-analysis of artists' pigments by grazing-emission X-ray fluorescence spectrometry”. Claes M, van Ham R, Janssens K, Van Grieken R, Klockenkämper R, von Bohlen A, Advances in X-ray analysis 41, 262 (1999)
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Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers”. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering 45, 277 (1999). http://doi.org/10.1016/S0167-9317(99)00180-X
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Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
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Determination of trace elements in organic matrices by grazing-emission X-ray fluorescence spectrometry”. Spolnik ZM, Claes M, Van Grieken R, Analytica chimica acta 401, 293 (1999). http://doi.org/10.1016/S0003-2670(99)00471-7
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X-ray fluorescence microtomography: experiment and reconstruction”. Simionovici AS, Chukalina M, Drakopoulos M, Snigireva I, Snigirev A, Schroer C, Lengeler B, Janssens K, Adams F page 304 (1999).
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Anion ordering in fluorinated La2CuO4”. Abakumov AM, Hadermann J, Van Tendeloo G, Shpanchenko RV, Oleinikov PN, Antipov EV, Journal of solid state chemistry 142, 311 (1999). http://doi.org/10.1006/jssc.1998.8064
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Monte Carlo simulation of X-ray fluorescence and scattering tomography experiments”. Vincze L, Janssens K, Vekemans B, Adams F page 328 (1999).
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Structural determination of the charge ordering process in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of solid state chemistry 148, 333 (1999). http://doi.org/10.1006/jssc.1999.8457
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Hybrid magnetic-semiconductor nanostructures”. Peeters FM, de Boeck J Academic Press, New York, page 345 (1999).
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Special issue: Proceedings of the 15th International Congress on X-ray Optics and Microanalysis”. Janssens K, Journal of analytical atomic spectroscopy 14, 357 (1999)
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New developments and applications in GDMS”. Bogaerts A, Gijbels R, Fresenius' journal of analytical chemistry 364, 367 (1999). http://doi.org/10.1007/s002160051352
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Mesoscopic superconducting disks: fluxoids in a box”. Peeters FM, Schweigert VA, Deo PS, Microelectronic engineering 47, 393 (1999). http://doi.org/10.1016/S0167-9317(99)00242-7
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Charge ordering-disordering in Th-doped CaMnO3”. Hervieu M, Martin C, Maignan A, Van Tendeloo G, Raveau B, European physical journal : B : condensed matter and complex systems 10, 397 (1999). http://doi.org/10.1007/s100510050869
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Snake orbits in hybrid semiconductor/ferromagnetic devices”. Peeters FM, Reijniers J, Badalian SM, Vasilopoulos P, Microelectronic engineering 47, 405 (1999). http://doi.org/10.1016/S0167-9317(99)00245-2
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The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Williams CT, Radtke M, Haller M, Knöchel A, Fresenius' journal of analytical chemistry 363, 413 (1999). http://doi.org/10.1007/S002160051212
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, Journal of analytical atomic spectrometry 14, 429 (1999). http://doi.org/10.1039/a807276k
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Zr substituted bismuth uranate”. Vannier R-N, Théry O, Kinowski C, Huvé, M, Van Tendeloo G, Suard E, Abraham F, Journal of materials chemistry 9, 435 (1999). http://doi.org/10.1039/a805829f
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Analyses of petrified wood by electron, X-ray and optical microprobes”. Kuczumov A, Vekemans B, Schalm O, Dorriné, W, Chevallier P, Dillmann P, Ro C-U, Janssens K, Van Grieken R, Journal of analytical atomic spectroscopy 14, 435 (1999). http://doi.org/10.1039/A806748A
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Morphology and defects in shallow trench isolation structures”. Stuer C, van Landuyt J, Bender H, Rooyackers R, Badenes G, Conference series of the Institute of Physics 164, 443 (1999)
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Risk analysis for the protection of cultural heritage from industrial pollution”. Moropoulou A, Bisbikou K, Torfs K, Van Grieken R page 475 (1999).
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Compositional distinctions between 16th century “Façon-de-Venise&rdquo, and Venetian glass vessels, excavated in Antwerp, Belgium”. Deraedt I, Janssens K, Veeckman J, Journal of analytical atomic spectroscopy 14, 483 (1999). http://doi.org/10.1039/A808385A
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Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Institute of physics conference series T2 –, Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND , 495 (1999)
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Characterization of AgxAuy nano particles by TEM and STEM”. de Vyt A, Gijbels R, Davock H, van Roost C, Geuens I, Journal of analytical atomic spectrometry 14, 499 (1999). http://doi.org/10.1039/a807695b
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Modelling of radio frequency capacitively coupled plasma at intermediate pressures”. Berezhnoi S, Kaganovich I, Bogaerts A, Gijbels R Kluwer Academic, Dordrecht, page 525 (1999).
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Modeling of photon scattering at high X-ray energies : experiment versus simulation”. Vincze L, Vekemans B, Janssens K, Adams F, Journal of analytical atomic spectrometry T2 –, 15th International Congress on X-Ray Optics and Microanalysis (ICXOM), AUG 24-27, 1998, ANTWERP, BELGIUM 14, 529 (1999). http://doi.org/10.1039/A808040B
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Investigation of the electron distribution functions in low pressure electron cyclotron resonance discharges”. Kaganovich I, Misina M, Bogaerts A, Gijbels R Kluwer Academic, Dordrecht, page 543 (1999).
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Composition of individual aerosol particles in the marine boundary layer over seas of the Western Russian Arctic”. Shevchenko VP, Van Grieken RE, van Malderen H, Lisitzin AP, Kuptsov VM, Serova VV, Doklady earth sciences 366, 546 (1999)
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Mobility collapse in undoped and Si-doped GaN grown by LP-MOVPE”. Bougrioua Z, Farvacque J-L, Moerman I, Demeester P, Harris JJ, Lee K, Van Tendeloo G, Lebedev O, Trush EJ, Physica status solidi: B: basic research 216, 571 (1999). http://doi.org/10.1002/(SICI)1521-3951(199911)216:1<571::AID-PSSB571>3.0.CO;2-K
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XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers”. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films 343/344, 583 (1999). http://doi.org/10.1016/S0040-6090(99)00122-4
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Monte-Carlo simulation of the coherent backscattering of electrons in a ballistic system”. Janssens KL, Peeters FM, Superlattices and microstructures 25, 615 (1999). http://doi.org/10.1006/spmi.1999.0697
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