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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
de Nolf, W.; Jaroszewicz, J.; Janssens, K.; Falkenberg, G. |
2θ-resolution obtainable during – XRPD experiments at Beamline L |
2008 |
|
|
|
UA library record |
|
|
|
Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
|
UA library record |
|
|
|
Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
|
|
|
UA library record |
|
|
|
Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
|
|
|
Van Grieken, R.E. |
X-ray spectrometry |
2000 |
|
15 |
|
UA library record |
|
|
|
Injuk, J.; Van Grieken, R. |
Sample preparation for X-ray fluorescence analysis |
2000 |
|
15 |
|
UA library record |
|
