Number of records found: 980
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Citations
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Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Brox O, Benninghoven A, Geuens I, de Keyzer R, (1997)
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Scanning microanalysis”. Oleshko V, Gijbels R Wiley-VCH, Weinheim, page 427 (1997).
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods”. Verlinden G, Gijbels R, Geuens I, , 995 (1998)
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Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals”. Verlinden G, Gijbels R, Geuens I, Benninghoven A, , 871 (1998)
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Modeling of bombardment induced oxidation of silicon with and without oxygen flooding”. de Witte H, Vandervorst W, Gijbels R, , 327 (1998)
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Charged-impurity correlations in Si ?-doped GaAs”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Effects of DX centers on electronic structure of a ?-doped quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2355 (1996)
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Magneto-polaron effect on shallow donors in 3D en Q2S systems”. Devreese JT, Shi JM, Peeters FM Kluwer, Dordrecht, page 173 (1993).
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Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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Laser microprobe mass spectrometry: local surface analysis of organic and inorganic compounds”. van Vaeck L, van Roy W, Struyf H, Poels K, Gijbels R Vch, Weinheim, page 354 (1997).
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Semiconductor”. Peeters FM McGraw-Hill, New York, page 350 (1997).
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Devices consisting of hybrid systems: ferro-magnetic and superconducting disks on top of a heterojunction”. Peeters FM, Li XQ, Matulis A, , 253 (1997)
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A cyclotron resonance study of the resonant polaron coupling in CdTe/CdMgTe quantum wells”. Chang CC, Michels JG, Cheng HH, Nicholas RJ, Peeters FM, Wu XG, Ossau W, Waag A, Landwehr G, , 383 (1997)
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Resonant magnetopolaron effects in GaAs/AlGaAs MQWs at high magnetic fields”. Wang YJ, Nickel HA, McCombe BD, Peeters FM, Hai GQ, Shi JM, Devreese JT, Wu XG, , 797 (1997)
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Theory of the magneto-transport in a nonplanar two dimensional electron gas”. Badalian SM, Ibrahim IS, Peeters FM, , 327 (1997)
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Modification of the 2D electronic properties in Si-δ-doped InSb due to surface effects”. de Keyser A, Bogaerts R, van Bockstal L, Herlach F, Karavolas VC, Peeters FM, van de Graaf W, Borghs G, , 383 (1997)
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The phase diagram”. Peeters FM Kluwer Academic Publishers, Dordrecht, page 17 (1997).
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TEM characterization of structural defects”. Van Tendeloo G Plenum Press, New York, page 473 (1996).
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Orientation fluctuations, diffuse scattering and orientational order in solid C60”. Michel KH, Copley JRD World Scientific, Singapore, page 381 (1996).
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Bogaerts A (1996) Mathematical modeling of a direct current glow discharge in argon. Universitaire Instelling Antwerpen, Antwerpen
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1996).
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Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques”. Oleshko VP, Gijbels R, Jacob W, , 46 (1996)
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Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry”. Gijbels R, Bogaerts A, , 71 (1996)
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Precision magnetometry on a submicron scale”. Geim AK, Lok JGS, Maan JC, Dubonos SV, Li XQ, Peeters FM, Nazarov YV, , 3311 (1996)
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Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices”. Marmorkos IK, Schweigert VA, Peeters FM, Lok JGS, , 2769 (1996)
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Melting of a quantum Wigner crystal in bi-layer structures”. Goldoni G, Peeters FM, , 2451 (1996)
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Effects of the DX centers on electronic structure of a δ-doped quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2355 (1996)
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Charged-impurity correlations in a δ-doped quantum barrier”. Koenraad PM, Shi JM, van de Stadt AFW, Smets A, Perenboom JAAJ, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, , 479 (1991)
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