Number of records found: 8874
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EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys”. Shi H, Frenzel J, Schryvers D, Materials science forum 738/739, 113 (2013). http://doi.org/10.4028/www.scientific.net/MSF.738-739.113
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Editorial : award for best X-Ray Spectrometry referee during 2011-2012”. Van Grieken R, X-ray spectrometry 42, 3 (2013). http://doi.org/10.1002/XRS.2428
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New members of the editorial board of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 42, 1 (2013). http://doi.org/10.1002/XRS.2431
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Molecular spectroscopy study of human tooth tissues affected by high dose of external ionizing radiation (caused by the nuclear catastrophe of the Chernobyl plant)”. Darchuk LA, Zaverbna LV, Worobiec A, Van Grieken R page 349 (2012).
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Water quality assessment in Pangani river basin, Tanzania : natural and anthropogenic influences on concentrations of nutrients and inorganic ions”. Hellar-Kihampa H, De Wael K, Lugwisha E, Van Grieken R, International journal of river basin management 11, 55 (2013). http://doi.org/10.1080/15715124.2012.759119
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Tytgat T (2012) Research and development of self-supporting TiO2 foams for removal of VOCs from ambient air. 164 p
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Photocatalytic removal of soot : unravelling of the reaction mechanism by EPR and in situ FTIR spectroscopy”. Smits M, Ling Y, Lenaerts S, Van Doorslaer S, ChemPhysChem : a European journal of chemical physics and physical chemistry 13, 4251 (2012). http://doi.org/10.1002/CPHC.201200674
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Ortho-II structure in ABa2Cu3O7-\delta compounds (A=Er, Nd, Pr, Sm, Yb)”. Krekels T, Zou H, Van Tendeloo G, Wagener D, Buchgeister M, Hosseini SM, Herzog P, Physica: C : superconductivity 196, 363 (1992). http://doi.org/10.1016/0921-4534(92)90458-O
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X-ray optics for synchrotron-radiation-induced X-ray micro fluorescence at the european synchrotron-radiation facility, Grenoble”. Vincze L, Janssens K, Adams F, Institute of physics conference series , 613 (1993)
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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Lead-mercury-based superconductors –, the 1212-cuprate Pb0.7Hg0.3Sr2+xCa0.7Nd0.3-xCu2O7-\delta and the new oxycarbonate Pb0.7Hg0.3Sr4Cu2CO3O7”. Martin C, Hervieu M, Huvé, M, Michel C, Maignan A, Van Tendeloo G, Raveau B, Physica: C : superconductivity 222, 19 (1994). http://doi.org/10.1016/0921-4534(94)90109-0
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The study of high Tc-superconducting materials by electron microscopy and electron diffraction”. Amelinckx S, Van Tendeloo G, van Landuyt J, Superconductor science and technology T2 –, SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND 4, S19 (1991). http://doi.org/10.1088/0953-2048/4/1S/003
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Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
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Quantitative mu-XRF analysis of heterogeneous samples”. Vincze L, Janssens K, Adams F, Jones K, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 175 (1995)
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Parameters influencing focussing capabilities of capillary optics”. Vincze L, Janssens K, Adams F, Larsson S, Rindby A, Engstrom P, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 161 (1995)
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A laboratory mu-XRF spectrometer employing capillary optics”. Janssens K, Vekemans B, Rindby A, Vincze L, Adams F, , 159 (1995)
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A new cuprate with mercury bilayers : the “2222&rdquo, oxide Hg2-xMxBa2Pr2Cu2O10-\delta (M= Cu,Pr)”. Huve M, Martin C, Maignan A, Michel C, Van Tendeloo G, Hervieu M, Raveau B, Journal of solid state chemistry 114, 230 (1995). http://doi.org/10.1006/jssc.1995.1033
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Nucleation and growth of the Ni5Al3 phase in Ni-Al austenite and martensite”. Schryvers D, Toth L, Ma Y, Tanner L, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 299 (1995). http://doi.org/10.1051/jp4:1995246
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Martensitic and related transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 225 (1995). http://doi.org/10.1051/jp4:1995235
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Crystal-structure of the double-hg-layer copper-oxide superconductor (Hg,Pr)2Ba2(Y,Ca)Cu2O8-\deltaas a function of doping”. Radaelli PG, Marezio M, Tholence JL, Debrion S, Santoro A, Huang Q, Capponi JJ, Chaillout C, Krekels T, Van Tendeloo G, The journal of physics and chemistry of solids 56, 1471 (1995). http://doi.org/10.1016/0022-3697(95)00084-4
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Microscopic theory of orientational disorder and lattice instability in solid C70”. Callebaut AK, Michel KH, Physical review : B : condensed matter and materials physics 52, 15279 (1995). http://doi.org/10.1103/PhysRevB.52.15279
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Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
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Photoelectric and electrical responses of several erbium silicide/silicon interfaces”. Muret P, Nguyen TTA, Frangis N, Van Tendeloo G, van Landuyt J, Applied surface science T2 –, International Symposium on Si Heterostructures –, From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE 102, 173 (1996). http://doi.org/10.1016/0169-4332(96)00042-6
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Electronic structure of a Si \delta-doped layer in a GaAs/AlxGa1-xAs/GaAs quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, Physical Review B 54, 7996 (1996). http://doi.org/10.1103/PhysRevB.54.7996
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Multiple orientational order parameters in solid C60”. Copley JRD, Michel KH, Physica: B : condensed matter T2 –, International Conference on Neutron Scattering, AUG 17-21, 1997, TORONTO, CANADA 241, 454 (1997). http://doi.org/10.1016/S0921-4526(97)00617-0
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Crystal structure of Bi6Sr8-xCa3+xO22(-0.5\leq x\leq1.7): a mixed valence bismuth oxide related to perovskite”. Luhrs CC, Molins E, Van Tendeloo G, Beltran-Porter D, Fuertes A, Chemistry of materials 10, 1875 (1998). http://doi.org/10.1021/cm9800377
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Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy”. Seo JW, Schryvers D, Vermeulen W, Richard O, Potapov P, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79, 1279 (1999). http://doi.org/10.1080/01418619908210361
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Microstructure and properties of oxygen controlled melt textured NdBaCuO superconductive ceramics”. Monot I, Tancret F, Laffez P, Van Tendeloo G, Desgardin G, Technology 65, 26 (1999). http://doi.org/10.1016/S0921-5107(99)00193-2
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Size mismatch : a crucial factor for generating a spin-glass insulator in manganites”. Maignan A, Martin C, Van Tendeloo G, Hervieu M, Raveau B, Physical review : B : condensed matter and materials physics 60, 15214 (1999). http://doi.org/10.1103/PhysRevB.60.15214
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Relation between structure, charge ordering and magnetotransport properties in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of magnetism and magnetic materials T2 –, Symposium G Material Physics Issues and Applications of Magnetic Oxides, at the E-MRS Spring Meeting, JUN 01-04, 1999, Strasbourg, France 211, 105 (2000). http://doi.org/10.1016/S0304-8853(99)00720-9
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