| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links  |
| Verlinden, G.; Gijbels, R.; Geuens, I. |
Photographic materials |
2001 |
|
|
|
UA library record |
| Michel, K.H.; Nikolaev, A.V.; Verberck, B. |
Theory of crystal structures of polymerized C60-fullerite and fullerides AC60, A=K, Rb, Cs |
2001 |
|
|
|
UA library record; WoS full record; |
| Hadermann, J.; Abakumov, A.M.; Lebedev, O.I.; Antipov, E.V.; Van Tendeloo, G. |
Structural changes in fluorinated T{'} and T* phases |
2000 |
|
|
|
UA library record |
| Cenian, A.; Chernukho, A.; Leys, C.; Bogaerts, A. |
Interactions between DC plasma and HF fields |
2001 |
|
|
|
UA library record |
| Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
|
|
|
UA library record |
| Adams, F.; Gijbels, R.; Van Grieken, R.; Dachang, Z. |
Inorganic mass spectrometry |
1993 |
|
|
|
UA library record |
| Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
| de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
|
|
|
UA library record |
| Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
|
|
UA library record |
| Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
|
|
|
UA library record |
| de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. |
XPS study of ion induced oxidation of silicon with and without oxygen flooding |
2000 |
|
|
|
UA library record |
| Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
|
|
|
UA library record; WoS full record; |
| Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
| Jochum, K.P.; Gijbels, R.; Adriaens, A. |
Multielementmassenspektrometrie (MMS) |
2000 |
|
|
|
UA library record |
| Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
|
|
|
UA library record |
| Giorgio, S.; Henry, C.R.; Pauwels, B.; Van Tendeloo, G. |
Gold particles supported on TiO2 |
2000 |
|
|
|
UA library record |
| Van Tendeloo, G.; Pauwels, B.; Geuens, P.; Lebedev, O. |
TEM of nanostructured materials |
2000 |
|
|
31 |
UA library record; WoS full record; WoS citing articles |
| Pauwels, B.; Van Tendeloo, G.; Bouwen, W.; Kuhn, L.T.; Lievens, P. |
Structural properties of Au clusters on MgO |
2000 |
|
|
|
UA library record |
| Kuhn, L.T.; Vanhoutte, F.; Cannaerts, M.; Neukermans, S.; Verschoren, G.; Bouwen, W.; van Haesendonck, C.; Lievens, P.; Silverans, R.E.; Pauwels, B.; Van Tendeloo, G. |
Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties |
2000 |
|
|
|
UA library record |
| Pauwels, B.; Van Tendeloo, G.; Joutsensaari, J.; Kauppinen, E.I. |
Electron microscopy on nanoparticles: structure of C60 and C70 nanopraticles |
1999 |
|
|
|
UA library record |
| Joutsensaari, J.; Ahonen, P.P.; Tapper, U.; Kauppinen, E.I.; Pauwels, B.; Amelinckx, S.; Van Tendeloo, G. |
Aerosol synthesis of nanostructured, ultrafine fullerene particles |
1999 |
|
|
|
UA library record |
| Joutsensaari, J.; Ahonen, P.P.; Tapper, U.; Kauppinen, E.I.; Pauwels, B.; Amelinckx, S.; Van Tendeloo, G. |
Crystallization of fullerene nanopraticles in an aerosol flow reactor |
1999 |
|
|
|
UA library record |
| Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
| Van Tendeloo, G.; Lebedev, O.I.; Verbist, K.; Abakumov, A.M.; Shpanchenko, R.V.; Antipov, E.V.; Blank, D.H.A. |
The local structure of YBCO based materials by TEM |
1999 |
|
|
|
UA library record; WoS full record; |
| van Landuyt, J.; Van Tendeloo, G. |
Charcaterization by high-resolution transmission electron microscopy |
1998 |
|
|
|
UA library record; WoS full record; |
| Takeda, M.; Shinohara, G.; Yamada, H.; Yoshida, S.; van Landuyt, J.; Hashimoto, H. |
Precipitation behavior in Cu-Co alloy |
1998 |
|
|
|
UA library record |
| Schryvers, D.; Goessens, C.; van Renterghem, W.; van Landuyt, J.; de Keyzer, R. |
Conventional and HREM study of structural defects in nanostructured silver halides |
1998 |
|
|
|
UA library record |
| van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. |
Defects in AgCl and AgBr(100) tabular crystals studied by TEM |
1998 |
|
|
|
UA library record |
| Nistor, L.C.; van Landuyt, J.; Dincã, G. |
HREM of defects in cubic boron nitride single crystals |
1998 |
|
|
|
UA library record; WoS full record; |
| van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
Defect related growth of tabular AgCl(100) crystals: a TEM study |
1998 |
|
|
|
UA library record; WoS full record; |
