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“Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals”. Verlinden G, Gijbels R, Geuens I, Benninghoven A, , 871 (1998)
Keywords: P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy”. Gregory C, Gijbels R, Jacob W, Geuens I, van Roost C, de Keyzer R, Journal of microscopy 188, 79 (1997)
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 1.692
Times cited: 6
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“Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, , 479 (1991)
Keywords: P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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