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Author Title Year Publication Volume Times cited Additional Links (down)
Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals 1998 UA library record
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy 1997 Journal of microscopy 188 6 UA library record; WoS full record; WoS citing articles
Geuens, I.; Gijbels, R.; Jacob, W. Depth profiling of silver halide microcrystals 1991 UA library record