Records |
Author |
Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Title |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
Type |
P3 Proceeding |
Year |
1998 |
Publication |
|
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
871-874 |
Keywords |
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
Wiley |
Place of Publication |
Chichester |
Editor |
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links ![sorted by Additional Links field, descending order (down)](img/sort_desc.gif) |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:20471 |
Serial |
1555 |
Permanent link to this record |
|
|
|
Author |
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
Title |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
Type |
A1 Journal article |
Year |
1997 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
Volume |
188 |
Issue |
|
Pages |
79-87 |
Keywords |
A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Oxford |
Editor |
|
Language |
|
Wos |
A1997YF51000009 |
Publication Date |
0000-00-00 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0022-2720 |
ISBN |
|
Additional Links ![sorted by Additional Links field, descending order (down)](img/sort_desc.gif) |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.692 |
Times cited |
6 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.692; 1997 IF: 1.083 |
Call Number |
UA @ lucian @ c:irua:20461 |
Serial |
1086 |
Permanent link to this record |
|
|
|
Author |
Geuens, I.; Gijbels, R.; Jacob, W. |
Title |
Depth profiling of silver halide microcrystals |
Type |
P3 Proceeding |
Year |
1991 |
Publication |
|
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
479-482 |
Keywords |
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
Wiley |
Place of Publication |
Chichester |
Editor |
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
8 |
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
|
Additional Links ![sorted by Additional Links field, descending order (down)](img/sort_desc.gif) |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
no |
Call Number |
UA @ lucian @ c:irua:1568 |
Serial |
650 |
Permanent link to this record |