Author |
Title |
Year |
Publication |
Volume |
Times cited |
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van Daele, B.; Van Tendeloo, G.; Ruythooren, W.; Derluyn, J.; Leys, M.R.; Germain, M. |
Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN |
2005 |
Springer proceedings in physics |
107 |
|
UA library record; WoS full record; |
Schowalter, M.; Rosenauer, A.; Titantah, J.T.; Lamoen, D. |
Calculation of Debye-Waller temperature factors for GaAs |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |
Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Effect of temperature on the 002 electron structure factor and its consequence for the quantification of ternary and quaternary III-V crystals |
2008 |
Springer proceedings in physics |
120 |
|
UA library record; WoS full record; |