“Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Physica status solidi: A: applied research
T2 –, International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland 171, 147 (1999). http://doi.org/10.1002/(SICI)1521-396X(199901)171:1<147::AID-PSSA147>3.0.CO;2-U
Abstract: In situ irradiation experiments in a high resolution electron microscope JEOL-4000EX at room temperature resulted in discovery of the isolated and combined clustering of vacancies and self-interstitial atoms on {111}- and {113}-habit planes both leading to an extended defect formation in Si crystals. The type of the defect is strongly affected by the type of supersaturation of point defects depending on the crystal thickness during electron irradiation. Because of the existence of energy barriers against recombination of interstitials with the extended aggregates of vacancies, a large family of intermediate defect configurations (IDCs) is formed on {113}- and {111}-habit planes at a low temperature under interstitial supersaturation in addition to the well-known {133}-defects of interstitial type. The formation of metastable IDCs inside vacancy aggregates prevents a way of recombination of defects in extended shape.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 40
DOI: 10.1002/(SICI)1521-396X(199901)171:1<147::AID-PSSA147>3.0.CO;2-U
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“Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers”. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering 45, 277 (1999). http://doi.org/10.1016/S0167-9317(99)00180-X
Abstract: A novel infrared absorption method has been developed to measure [he interstitial oxygen concentration in highly doped silicon. Thin samples of the order of 10-30 mu m are prepared in an essentially stress-free state without changing the state of the crystal. The oxygen concentration is then determined by measuring the height of the 1136-cm(-1) absorption peak due to interstitial oxygen at 5.5 K. The obtained results on as-grown samples are compared with those from gas fusion analysis. The precipitated oxygen concentration in annealed samples is also determined with the new method. It will be shown that the interstitial oxygen concentration in highly doped silicon can be determined with high accuracy and down to concentrations of 10(17) cm(-3). (C) 1999 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 1.806
DOI: 10.1016/S0167-9317(99)00180-X
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“Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3”. Lemmens H, Richard O, Van Tendeloo G, Bismayer U, Journal of electron microscopy 48, 843 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023756
Abstract: The microstructure and phase transitions in the perovskite-based ferroelectric lead scandium tantalate, Pb(Sc0.5Ta0.5)O-3 have been investigated by transmission electron microscopy. The effects of ordering of Sc and Ta cations are apparent in reciprocal space as well as in direct space images. High-resolution observations allow direct structure imaging of the domain structure. The structure of the low temperature ferroelectric phase is studied by selected area electron diffraction (SAED) and electron microdiffraction. The relaxer behaviour of this paraelectric-ferroelectric transition is displayed by diffuse intensities in the SAED patterns at temperatures around the Curie point.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.9
Times cited: 7
DOI: 10.1093/oxfordjournals.jmicro.a023756
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“Josephson phenomenology and microstructure of YBaCuO artificial grain boundaries characterized by misalignment of the c-axes”. Tafuri F, Granozio FM, Carillo F, Lombardi F, Di Uccio US, Verbist K, Lebedev O, Van Tendeloo G, Physica: C : superconductivity 327, 63 (1999). http://doi.org/10.1016/S0921-4534(99)00372-X
Abstract: YBa(2)Cu(3)O(7-delta) (YBCO) grain boundaries characterized by a misalignment of the c-axes (45 degrees c-axis tilt or 45 degrees c-axis twist) have been obtained by employing a recently implemented biepitaxial technique. Junctions based on these grain boundaries exhibit good Josephson properties useful for applications. High values of the I(C)R(N) product and a Fraunhofer-like dependence of the critical current on the magnetic field, differently from traditional biepitaxial junctions, have been obtained. The correlation between transport properties and microstructure has been investigated by Transmission Electron Microscopy (TEM), which was also performed on previously measured junctions. The presence of atomically clean basal plane (BP) faced tilt boundaries, among other types of interfaces, has been shown. The possibility of selecting these kinds of boundaries by controlling film growth, and their possible advantages in terms of reproducibility and uniformity of the junction properties an discussed. The possibility of employing these junctions to explore the symmetry of the order parameter is also discussed. (C) 1999 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
Times cited: 7
DOI: 10.1016/S0921-4534(99)00372-X
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“Characterization of Asian dust using ultrathin window EPMA”. Ro C-U, Oh K-Y, Kim HK, Chun Y, Van Grieken R, (1999)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Elemental x-ray images obtained by grazing-exit electron probe microanalysis (GE-EPMA)”. Tsuji K, Nullens R, Wagatsuma K, Van Grieken RE, Journal of analytical atomic spectrometry 14, 1711 (1999). http://doi.org/10.1039/A905301H
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1039/A905301H
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“Chemische en morfologische karakterisatie van de grissailles van Capronnier met behulp van EPXMA”. Schalm O, Janssens K, Caen J, Adams F, (1999)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Mobility collapse in undoped and Si-doped GaN grown by LP-MOVPE”. Bougrioua Z, Farvacque J-L, Moerman I, Demeester P, Harris JJ, Lee K, Van Tendeloo G, Lebedev O, Trush EJ, Physica status solidi: B: basic research 216, 571 (1999). http://doi.org/10.1002/(SICI)1521-3951(199911)216:1<571::AID-PSSB571>3.0.CO;2-K
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.674
Times cited: 13
DOI: 10.1002/(SICI)1521-3951(199911)216:1<571::AID-PSSB571>3.0.CO;2-K
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“Structural determination of the charge ordering process in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of solid state chemistry 148, 333 (1999). http://doi.org/10.1006/jssc.1999.8457
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 12
DOI: 10.1006/jssc.1999.8457
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“_Fe2O3 nanoparticles with mesoporous MCM-48 silica: in situ formation and characterisation”. Fröba M, Köhn R, Bouffaud G, Richard O, Van Tendeloo G, Chemistry of materials 11, 2858 (1999). http://doi.org/10.1021/cm991048i
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 9.466
Times cited: 202
DOI: 10.1021/cm991048i
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“Microstructure and Josephson phenomenology in 45°, tilt and twist Yba2Cu3o7-\delta artificial grain boundaries”. Tafuri F, Miletto Granozio F, Carillo F, di Chiara A, Verbist K, Van Tendeloo G, Physical review : B : condensed matter and materials physics 59, 11523 (1999). http://doi.org/10.1103/PhysRevB.59.11523
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 52
DOI: 10.1103/PhysRevB.59.11523
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“Synthesis of single wall carbon nanotubes by catalytic decomposition of hydrocarbons”. Colomer J-F, Bister G, Willems I, Konya Z, Fonseca A, Van Tendeloo G, Nagy JB, Chemical communications , 1343 (1999). http://doi.org/10.1039/a903142a
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 6.319
Times cited: 110
DOI: 10.1039/a903142a
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“Charge ordering-disordering in Th-doped CaMnO3”. Hervieu M, Martin C, Maignan A, Van Tendeloo G, Raveau B, European physical journal : B : condensed matter and complex systems 10, 397 (1999). http://doi.org/10.1007/s100510050869
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.461
Times cited: 6
DOI: 10.1007/s100510050869
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“A homologous series Pb2n+1Nb2n-1O7n-1 studied by electron microscopy”. Leroux C, Badeche T, Nihoul G, Richard O, Van Tendeloo G, European physical journal: applied physics 7, 33 (1999). http://doi.org/10.1051/epjap:1999196
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.684
Times cited: 4
DOI: 10.1051/epjap:1999196
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“The phase transition and crystal structures of Ba3RM2O7.5 complex oxides (R=rare-earth elements, M = Al,Ga)”. Abakumov AM, Shpanchenko RV, Lebedev OI, Van Tendeloo G, Amelinckx S, Antipov EV, Acta crystallographica: section A: foundations of crystallography 55, 828 (1999). http://doi.org/10.1107/S0108767399002068
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.725
Times cited: 7
DOI: 10.1107/S0108767399002068
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“Room temperature and low-temperature structure of Nd1-xCaxMnO3 (0.3*x*0.5)”. Richard O, Schuddinck W, Van Tendeloo G, Millange F, Hervieu M, Caignaert C, Raveau B, Acta crystallographica: section A: foundations of crystallography 55, 704 (1999). http://doi.org/10.1107/S0108767398012215
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.725
Times cited: 24
DOI: 10.1107/S0108767398012215
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“Zr substituted bismuth uranate”. Vannier R-N, Théry O, Kinowski C, Huvé, M, Van Tendeloo G, Suard E, Abraham F, Journal of materials chemistry 9, 435 (1999). http://doi.org/10.1039/a805829f
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 4
DOI: 10.1039/a805829f
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“A study of the domain structure of epitaxial (La-Ca)MnO3 films by high-resolution transmission electron microscopy”. Lebedev OI, Van Tendeloo G, Abakumov AM, Amelinckx S, Leibold B, Habermeier H-U, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79, 1461 (1999). http://doi.org/10.1080/01418619908210372
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 27
DOI: 10.1080/01418619908210372
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“Multiply twinned C60 and C70 nanoparticles”. Pauwels B, Bernaerts D, Amelinckx S, Van Tendeloo G, Joutsensaari J, Kauppinen EI, Journal of crystal growth 200, 126 (1999). http://doi.org/10.1016/S0022-0248(98)01285-8
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.751
Times cited: 17
DOI: 10.1016/S0022-0248(98)01285-8
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“Microstructure of tough polycrystalline natural diamond”. Chen JH, Van Tendeloo G, Journal of electron microscopy 48, 121 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023658
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.9
Times cited: 9
DOI: 10.1093/oxfordjournals.jmicro.a023658
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“Influence of laser and isothermal treatments on microstructural properties of SnO2 films”. Rembeza ES, Richard O, van Landuyt J, Materials research bulletin 34, 1527 (1999). http://doi.org/10.1016/S0025-5408(99)00188-9
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.446
Times cited: 17
DOI: 10.1016/S0025-5408(99)00188-9
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“Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition”. Mihailescu IN, Gyorgy E, Marin G, Popescu M, Teodorescu VS, van Landuyt J, Grivas C, Hatziapostolou A, Journal of vacuum science and technology: A: vacuum surfaces and films 17, 249 (1999). http://doi.org/10.1116/1.581579
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.374
Times cited: 8
DOI: 10.1116/1.581579
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“Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays”. Cloetens P, Ludwig W, Baruchel J, van Dyck D, van Landuyt J, Guigay JP, Schlenker M, Applied physics letters 75, 2912 (1999). http://doi.org/10.1063/1.125225
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Impact Factor: 3.411
Times cited: 481
DOI: 10.1063/1.125225
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“Martensitic transformations and microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275, 697 (1999). http://doi.org/10.1016/S0921-5093(99)00399-8
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.094
Times cited: 6
DOI: 10.1016/S0921-5093(99)00399-8
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“Oscillating sliding wear of mono- and multilayer ceramic coatings in air”. Huq MZ, Celis JP, Meneve J, Stals L, Schryvers D, Surface and coatings technology 113, 242 (1999). http://doi.org/10.1016/S0257-8972(99)00009-2
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.589
Times cited: 10
DOI: 10.1016/S0257-8972(99)00009-2
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“Nanohardness and structure of nitrogen implanted SixAly coatings post-implanted with oxygen”. Jacobs M, Bodart F, Terwagne G, Schryvers D, Poulet A, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 147, 231 (1999). http://doi.org/10.1016/S0168-583X(98)00535-7
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.109
Times cited: 3
DOI: 10.1016/S0168-583X(98)00535-7
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“Structural transformations in the fluorinated T* phase”. Hadermann J, Abakumov AM, Lebedev OI, Van Tendeloo G, Rozova MG, Shpanchenko RV, Pavljuk BP, Kopnin EM, Antipov EV, Journal of solid state chemistry 147, 647 (1999). http://doi.org/10.1006/jssc.1999.8438
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 8
DOI: 10.1006/jssc.1999.8438
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“Anion ordering in fluorinated La2CuO4”. Abakumov AM, Hadermann J, Van Tendeloo G, Shpanchenko RV, Oleinikov PN, Antipov EV, Journal of solid state chemistry 142, 311 (1999). http://doi.org/10.1006/jssc.1998.8064
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 20
DOI: 10.1006/jssc.1998.8064
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“Simultaneous investigation of vertical transport and intersubband absorption in a superlattice: continuum Wannier-Strak ladders and next-nearest neighbor tunneling”. Helm M, Hilber W, Strasser G, de Meester R, Peeters FM, Wacker A, Physica: B : condensed matter 272, 194 (1999). http://doi.org/10.1016/S0921-4526(99)00269-0
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 1.386
Times cited: 1
DOI: 10.1016/S0921-4526(99)00269-0
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“Quantum charge density fluctuations and the γ-&alpha, phase transition in Ce”. Nikolaev AV, Michel KH, European physical journal : B : condensed matter and complex systems 9, 619 (1999). http://doi.org/10.1007/s100510050806
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 1.461
Times cited: 19
DOI: 10.1007/s100510050806
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