“Energy-dispersive X-ray fluorescence for trace metals analysis of water”. Vanderborght B, Van Grieken R page 1 (1975).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Perspectieven voor energie-dispersieve X-stralen fluorescentie bij de wateranalyse”. Vanderborght B, Van Grieken R, Hydrographica 1, 19 (1975)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Trace metal analysis of water containing humic substances by X-ray fluorescence”. Vanderborght BM, Van Grieken RE, International journal of environmental analytical chemistry 5, 221 (1978). http://doi.org/10.1080/03067317808071147
Abstract: Chelation by oxine followed by adsorption on activated carbon results in the efficient collection of many trace metal ions, independent of the trace metal concentration and of high alkali and alkaline earth ion abundances. Preconcentration factors around 10000 are often achieved. When this preconcentration procedure is combined with energy-dispersive X-ray fluorescence, accurate and precise analysis can be carried out, as was proven in several experiments. The technique can also be applied for the determination of divalent ions in natural waters containing up to 10 ppm of humic substances. Trivalent ions can quantitatively be collected from natural water provided suKicient activated carbon is added. Omitting the oxine chelation prior to the activated carbon adsorption step still results in collection of a sometimes important fraction of the trace metal ions from natural waters. This is related to organically bound or colloidal forms of the trace metals.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1080/03067317808071147
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“Water analysis by spark-source mass-spectrometry after preconcentration on activated carbon”. Vanderborght BM, Van Grieken RE, Talanta : the international journal of pure and applied analytical chemistry 27, 417 (1980). http://doi.org/10.1016/0039-9140(80)80225-6
Abstract: For trace analyses of environmental waters, spark-source mass-spectrometry has been combined with a preconcentration procedure involving chelation of the dissolved trace elements with oxine and subsequent adsorption of the oxinates and naturally occurring organic and colloidal metal species onto activated carbon. The activated carbon is filtered off and ashed at low temperature. The residue is dissolved, an internal standard and pure graphite are added and, after drying, the electrodes are prepared. The photographically recorded mass spectrum is evaluated by a suitable computer routine. The error of the procedure is around 30%. While this preconcentration and analysis procedure is capable of measuring about 40 elements quantitatively, in practice 1025 trace elements are determined simultaneously above the 0.1-μg/l. detection limit, as is illustrated by analyses of drinking water, surface and ground water samples. Although a sophisticated technique, SSMS can be considered for regular panoramic survey analyses.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0039-9140(80)80225-6
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“Enrichment of trace metals in water by adsorption on activated carbon”. Vanderborght BM, Van Grieken RE, Analytical chemistry 49, 311 (1977)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Reduction of trace metal levels in analytical-grade activated carbon”. Vanderborght B, Van Grieken R, Analytica chimica acta 89, 399 (1977). http://doi.org/10.1016/S0003-2670(01)84739-5
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0003-2670(01)84739-5
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“Enrichment procedures for water analysis by X-ray energy spectrometry”. Van Grieken R, Bresseleers K, Smits J, Vanderborght B, Vanderstappen M, (1976)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Chelex-100 ion-exchange filter membranes for preconcentration in x-ray-fluorescence analysis of water”. Van Grieken RE, Bresseleers CM, Vanderborght BM, Analytical chemistry 49, 1326 (1977). http://doi.org/10.1021/AC50017A011
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC50017A011
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“Automated evaluation of photographically recorded spark-source mass spectra”. Vanderborght B, Van Grieken R, Analytica chimica acta 103, 223 (1978). http://doi.org/10.1016/S0003-2670(01)84041-1
Abstract: A computer routine was developed for qualitative and quantitative analysis of photographically recorded spark-source mass spectra. Particular attention is given to the case of a graphite matrix. The program starts from the line intensities (expressed as Seidel values) and isotope masses calculated from the densitometer readings by a commercially available routine. From the intensities in the different exposures (typically 15 stages), it computes the parameters for the linear parts of the density curves for each ion. Taking into account mutual interferences of multivalent ions, isotope or C-clusters, oxide, carbide and dicarbide ions, the program automatically identifies and then quantifies the elements present. The precision of the results is around 5%. Reading and complete processing of one photoplate is achieved within 23 h.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0003-2670(01)84041-1
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“Spark-source mass-spectrometric sensitivity factors for elements in a graphite matrix”. Vanderborght B, Van Grieken R, Talanta : the international journal of pure and applied analytical chemistry 26, 461 (1979). http://doi.org/10.1016/0039-9140(79)80111-3
Abstract: Relative sensitivity factors for determination of 41 elements by spark-source mass-spectrometry have been measured. The samples were pressed into graphite electrodes and ionized with a radiofrequency spark. The mass spectra were recorded on a photoplate and the resulting data processed by a computer. Indium was used as standard and the relative sensitivity factors for both singly- and doubly-charged ions were determined with reference to the singly-charged indium ion, with an overall error of 30%. The mean analysis precision was 16%.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0039-9140(79)80111-3
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