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Author | Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G. | ||||
Title | Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction | Type | A1 Journal article | ||
Year | 1997 | Publication | Journal of crystal growth | Abbreviated Journal | J Cryst Growth |
Volume | 172 | Issue | Pages | 175-182 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | A1997WL48900024 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0022-0248 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.751 | Times cited | 29 | Open Access | |
Notes | Approved | Most recent IF: 1.751; 1997 IF: 1.259 | |||
Call Number | UA @ lucian @ c:irua:21402 | Serial | 1394 | ||
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