| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links  |
| Hadermann, J.; Abakumov, A.M.; Van Tendeloo, G.; Shpanchenko, R.V.; Oleinikov, P.N.; Antipov, E.V. |
Anion ordering in fluorinated La2CuO4 |
1999 |
|
|
|
UA library record; WoS full record; |
| van Roy, W.; van Vaeck, L.; Gijbels, R. |
Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis |
1992 |
|
|
|
UA library record |
| Nikolaev, A.V.; Michel, K.H.; Copley, J.R.D. |
Orientational disorder and order in C60-fullerite and in MC60-alkali metal fullerides |
1999 |
|
|
|
UA library record |
| de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
|
|
|
UA library record; WoS full record; |
| Bogaerts, A. |
Glow discharge mass spectrometry, methods |
2000 |
|
|
|
UA library record |
| Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
|
|
UA library record |
| van Landuyt, J.; Van Tendeloo, G. |
HREM for characterisation of nanoscale microstructures |
1998 |
|
|
|
UA library record |
| Seo, J.W.; Perret, J.; Fompeyrine, J.; Van Tendeloo, G.; Loquet, J.-P. |
Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE |
1998 |
|
|
|
UA library record; WoS full record; |
| Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. |
Investigation of the electron distribution functions in low pressure electron cyclotron resonance discharges |
1999 |
|
|
|
UA library record; WoS full record; |
| Berezhnoi, S.; Kaganovich, I.; Bogaerts, A.; Gijbels, R. |
Modelling of radio frequency capacitively coupled plasma at intermediate pressures |
1999 |
|
|
|
UA library record; WoS full record; |
| Vanwelkenhuysen, I.; Gijbels, R.; Geuens, I. |
Influence of the temperature on the morphology of silver behenate microcrystals |
1998 |
|
|
|
UA library record |
| de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
|
|
|
UA library record |
| Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
|
|
|
UA library record; WoS full record; |
| Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
|
|
|
UA library record; WoS full record; |
| Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.; van Daele, A.J. |
Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
|
|
|
UA library record |
| Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
|
|
|
UA library record |
| Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1998 |
|
|
|
UA library record |
| Gijbels, R.; Oleshko, V. |
Scanning microanalysis |
1998 |
|
|
|
UA library record |
| Peeters, F.M.; Partoens, B.; Schweigert, V.A.; Schweigert, I.V. |
Classical atomic bilayers |
1998 |
|
|
|
UA library record; WoS full record; |
| Peeters, F.M.; de Boeck, J. |
Hybrid magnetic-semiconductor nanostructures |
1999 |
|
|
|
UA library record |
| Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
|
|
|
UA library record |
| van Landuyt, J.; van Bockstael, M.H.G.; van Royen, J. |
Microscopy of gemmological materials |
1997 |
|
|
4 |
UA library record; WoS full record; WoS citing articles |
| Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Handbook of microscopy: applications in materials science, solid-state physics and chemistry |
1997 |
|
|
|
UA library record |
| de Hosson, J.T.M.; Van Tendeloo, G. |
Superconducting ceramics |
1997 |
|
|
|
UA library record |
| de Hosson, J.T.M.; Van Tendeloo, G. |
Metals and alloys |
1997 |
|
|
|
UA library record |
| Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation |
1997 |
|
|
|
UA library record |
| Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
|
UA library record |
| Oleshko, V.; Gijbels, R.; Jacob, W. |
Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides |
1998 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Schryvers, D.; Gijbels, R.; Jacob, W. |
Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM |
1998 |
|
|
|
UA library record |
| Pentcheva, E.N.; Van 't dack, L.; Veldeman, E.; Hristov, V.; Gijbels, R. |
Hydrochemical characteristics of geothermal systems in South Bulgaria |
1997 |
|
|
|
UA library record |
