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“Preface”. Van Grieken R, Janssens K page vii-viii (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“A survey of the recent use of x-ray beam methods for non-destructive investigations in the cultural heritage sector”. Janssens K page 265 (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“A case study of high-temperature corrosion in rotary cement kilns”. Potgieter JH, Godoi RHM, Van Grieken R, Journal of the South African Institute of Mining and Metallurgy 104, 603 (2004)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Assessment of air pollutant levels in some European museums and churches”. Kontozova V, Spolnik Z, Worobiec A, Godoi R, Van Grieken R, Deutsch F, Bencs L page 245 (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Laboratory Experimental Medicine and Pediatrics (LEMP)
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“Hollow cathode discharges with gas flow: numerical modelling for the effect on the sputtered atoms and the deposition flux”. Bogaerts A, Okhrimovskyy A, Baguer N, Gijbels R, Plasma sources science and technology 14, 191 (2005). http://doi.org/10.1088/0963-0252/14/1/021
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 3.302
Times cited: 9
DOI: 10.1088/0963-0252/14/1/021
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“Preface”. Janssens K, Van Grieken R page xxvii-xxviii (2004).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Introduction and overview”. Janssens K, Van Grieken R page 1 (2004).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“X-ray based methods of analysis”. Janssens K page 129 (2004).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Provenance analysis of glass artefacts”. Gratuze B, Janssens K page 663 (2004).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Enhanced transmission versus localization of a light pulse by a subwavelength metal slit”. Kukhlevsky SV, Mechler M, Csapo L, Janssens K, Samek O, Physical review : B : condensed matter and materials physics 70, 195428 (2004). http://doi.org/10.1103/PHYSREVB.70.195428
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.836
Times cited: 17
DOI: 10.1103/PHYSREVB.70.195428
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“In-vivo 3D mapping and local speciation of Se compounds in roots and leaves of Allium Cepa”. Janssens K, Proost K, Wysocka A, Bulska E, Wierzbicka M (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Investigation of the chemical state and 3D distribution of Mn in corroded glass fragments”. Proost K, Schalm O, Janssens K, Van Dyck D (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Vision lab
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“Estimation of relative Fe2+ and Fe3+ contents of original manuscript fragments by means of μ-XANES and Mössbauer spectrometry”. Janssens K, Vekemans B, Rouchon-Quillet V (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Characterization of carcinogenic Ni-rich dust particles by scanning micro-XRF/XRD at BL L”. de Nolf W, Janssens K, Rickers K (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Confocal micro-XRF study of element distribution of a uranium enriched tertiary sediment”. Janssens K, Denecke M, Rothe J, Simon R page 13 (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Electron-energy-loss spectra of NiO”. Dobysheva LV, Potapov PL, Schryvers D, Physical review : B : condensed matter and materials physics 69, 184404 (2004). http://doi.org/10.1103/PhysRevB.69.184404
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 17
DOI: 10.1103/PhysRevB.69.184404
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“Application of EDXRF and thin window EPMA for the investigation of the influence of hot air heating on the generation and deposition of particulate matter”. Spolnik Z, Bencs L, Worobiec A, Kontozova V, Van Grieken R, Microchimica acta 149, 79 (2005). http://doi.org/10.1007/S00604-004-0299-Y
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Laboratory Experimental Medicine and Pediatrics (LEMP)
DOI: 10.1007/S00604-004-0299-Y
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“X-ray spectrometry for air pollution and cultural heritage research”. Van Grieken R, Delalieux F, (2004)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Synthesis, cation ordering, and magnetic properties of the (Sb1-xPbx)2(Mn1-ySby)O4 solid solutions with the Sb2MnO4-type structure”. Abakumov AM, Rozova MG, Antipov EV, Hadermann J, Van Tendeloo G, Lobanov MV, Greenblatt M, Croft M, Tsiper EV, Llobet A, Lokshin KA, Zhao Y, Chemistry of materials 17, 1123 (2005). http://doi.org/10.1021/cm048791h
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 9.466
Times cited: 16
DOI: 10.1021/cm048791h
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“Transmission electron microscopy and structural phase transitions in anion-deficient perovskite-based oxides”. Hadermann J, Van Tendeloo G, Abakumov AM, Acta crystallographica: section A: foundations of crystallography 61, 77 (2005). http://doi.org/10.1107/S0108767304023013
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.725
Times cited: 18
DOI: 10.1107/S0108767304023013
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“Use of solid-phase microextraction for the detection of acetic acid by ion-trap gas chromatography-mass spectrometry and application to indoor levels in museums”. Godoi AFL, Van Vaeck L, Van Grieken R, Journal of chromatography: A: bibliography section 1067, 331 (2005). http://doi.org/10.1016/J.CHROMA.2004.12.054
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/J.CHROMA.2004.12.054
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“Single-particle characterization of four “Asian Dust&rdquo, samples collected in Korea, using low-Z particle electron probe X-ray microanalysis”. Ro C-U, Hwang H, Kim HK, Chun Y, Van Grieken R, Environmental science and technology 39, 1409 (2005). http://doi.org/10.1021/ES049772B
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/ES049772B
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“Laser ablation of Cu and plume expansion into 1 atm ambient gas”. Chen Z, Bogaerts A, Journal of applied physics 97, 063305 (2005). http://doi.org/10.1063/1.1863419
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 2.068
Times cited: 131
DOI: 10.1063/1.1863419
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“sp3/sp2 characterization of carbon materials from first-principles calculations: X-ray photoelectron versus high energy electron energy-loss spectroscopy techniques”. Titantah JT, Lamoen D, Carbon 43, 1311 (2005). http://doi.org/10.1016/j.carbon.2005.01.002
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 6.337
Times cited: 70
DOI: 10.1016/j.carbon.2005.01.002
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“Ab initio computation of the mean inner Coulomb potential of amorphous carbon structures”. Schowalter M, Titantah JT, Lamoen D, Kruse P, Applied physics letters 86, 112102 (2005). http://doi.org/10.1063/1.1885171
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.411
Times cited: 15
DOI: 10.1063/1.1885171
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Brunekreef B, Janssen N A.H., de Hartog J J., Oldenwening M, Meliefste K, Hoek G, Lanki T, Timonen K L., Vallius M, Pekkanen J, Van Grieken R (2005) Personal, indoor, and outdoor exposures to PM2.5 and its components for groups of cardiovascular patients in Amsterdam and Helsinki
Keywords: Minutes and reports; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Imaging TOF-SIMS for the surface analysis of silver halide microcrystals”. Lenaerts J, Gijbels R, van Vaeck L, Verlinden G, Geuens I, Applied surface science 203/204, 614 (2003). http://doi.org/10.1016/S0169-4332(02)00777-8
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 3.387
Times cited: 7
DOI: 10.1016/S0169-4332(02)00777-8
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“Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks”. de Witte H, Conard T, Vandervorst W, Gijbels R, Applied surface science 203, 523 (2003). http://doi.org/10.1016/S0169-4332(02)00728-6
Abstract: We analyzed ultra-thin ZrO2/SiO2/Si gate dielectrics under post-deposition anneals in dry O-2 at temperatures from 500 to 700 degreesC. TOF-SIMS profiling of ZrO2/SiO2/Si stacks is hampered by many sputter induced artifacts. The depletion of oxygen leads to a decrease in SIMS intensities. However, preferential sputtering is accompanied by transport of the depleted species towards the surface. Due to recoil implantation oxygen gets piled-up near the ZrO2/SiO2 interface. Either normal or radiation-enhanced diffusion transports oxygen back to the surface. Simultaneously also segregation of zirconium towards and through the interface is observed, resulting in a large zirconium tail in the underlying silicon substrate. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 3.387
Times cited: 15
DOI: 10.1016/S0169-4332(02)00728-6
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“Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study”. Ignatova VA, Conard T, Möller W, Vandervorst W, Gijbels R, Applied surface science 231/232, 603 (2004). http://doi.org/10.1016/j.apsusc.2004.03.121
Abstract: This study is dedicated to a better understanding of the processes occurring under ion bombardment of ultra-thin ZrO2/SiO2/Si gate dielectric stacks. Complex-shaped depth profiles were obtained by using TOF-SIMS with dual beam (500 eV for sputtering and 10 keV for analysis) Ar+ ions. The SIMS intensities of all the elements depend critically on the amount of oxygen at any moment of the sputtering process. Increased intensity is observed at the surface and at the ZrO2/SiO2 interface. A long tail of the Zr signal is present in the Si substrate, even after the second (SiO2/Si) interface, and a double bump structure in the Zr-90 and ZrO dimer is observed, which is more pronounced with increasing thickness of the interfacial SiO2 layer. Computer simulations using the dynamic Monte Carlo code (TRIDYN) are performed in order to distinguish the ion bombardment-induced effects from changes in the ionization degree. The original code is extended with simple models for the ionization mechanism and for the molecular yield during sputtering. Oxygen preferential sputtering at the surface and ballistic transport of Zr towards and through the interface are clearly demonstrated, but there is also evidence that due to recoil implantation oxygen gets piled-up near the ZrO2/SiO2 interface. (C) 2004 Elsevier B.V. All rights reserved.
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 3.387
Times cited: 4
DOI: 10.1016/j.apsusc.2004.03.121
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“Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 6.32
Times cited: 67
DOI: 10.1021/ac049108d
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