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“Enhanced transmission versus localization of a light pulse by a subwavelength metal slit”. Kukhlevsky SV, Mechler M, Csapo L, Janssens K, Samek O, Physical review : B : condensed matter and materials physics 70, 195428 (2004). http://doi.org/10.1103/PHYSREVB.70.195428
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.836
Times cited: 17
DOI: 10.1103/PHYSREVB.70.195428
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“Electron-energy-loss spectra of NiO”. Dobysheva LV, Potapov PL, Schryvers D, Physical review : B : condensed matter and materials physics 69, 184404 (2004). http://doi.org/10.1103/PhysRevB.69.184404
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 17
DOI: 10.1103/PhysRevB.69.184404
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“Application of EDXRF and thin window EPMA for the investigation of the influence of hot air heating on the generation and deposition of particulate matter”. Spolnik Z, Bencs L, Worobiec A, Kontozova V, Van Grieken R, Microchimica acta 149, 79 (2005). http://doi.org/10.1007/S00604-004-0299-Y
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Laboratory Experimental Medicine and Pediatrics (LEMP)
DOI: 10.1007/S00604-004-0299-Y
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“Synthesis, cation ordering, and magnetic properties of the (Sb1-xPbx)2(Mn1-ySby)O4 solid solutions with the Sb2MnO4-type structure”. Abakumov AM, Rozova MG, Antipov EV, Hadermann J, Van Tendeloo G, Lobanov MV, Greenblatt M, Croft M, Tsiper EV, Llobet A, Lokshin KA, Zhao Y, Chemistry of materials 17, 1123 (2005). http://doi.org/10.1021/cm048791h
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 9.466
Times cited: 16
DOI: 10.1021/cm048791h
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“Transmission electron microscopy and structural phase transitions in anion-deficient perovskite-based oxides”. Hadermann J, Van Tendeloo G, Abakumov AM, Acta crystallographica: section A: foundations of crystallography 61, 77 (2005). http://doi.org/10.1107/S0108767304023013
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.725
Times cited: 18
DOI: 10.1107/S0108767304023013
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“Use of solid-phase microextraction for the detection of acetic acid by ion-trap gas chromatography-mass spectrometry and application to indoor levels in museums”. Godoi AFL, Van Vaeck L, Van Grieken R, Journal of chromatography: A: bibliography section 1067, 331 (2005). http://doi.org/10.1016/J.CHROMA.2004.12.054
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/J.CHROMA.2004.12.054
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“Single-particle characterization of four “Asian Dust&rdquo, samples collected in Korea, using low-Z particle electron probe X-ray microanalysis”. Ro C-U, Hwang H, Kim HK, Chun Y, Van Grieken R, Environmental science and technology 39, 1409 (2005). http://doi.org/10.1021/ES049772B
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/ES049772B
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“Laser ablation of Cu and plume expansion into 1 atm ambient gas”. Chen Z, Bogaerts A, Journal of applied physics 97, 063305 (2005). http://doi.org/10.1063/1.1863419
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 2.068
Times cited: 131
DOI: 10.1063/1.1863419
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“sp3/sp2 characterization of carbon materials from first-principles calculations: X-ray photoelectron versus high energy electron energy-loss spectroscopy techniques”. Titantah JT, Lamoen D, Carbon 43, 1311 (2005). http://doi.org/10.1016/j.carbon.2005.01.002
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 6.337
Times cited: 70
DOI: 10.1016/j.carbon.2005.01.002
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“Ab initio computation of the mean inner Coulomb potential of amorphous carbon structures”. Schowalter M, Titantah JT, Lamoen D, Kruse P, Applied physics letters 86, 112102 (2005). http://doi.org/10.1063/1.1885171
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.411
Times cited: 15
DOI: 10.1063/1.1885171
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“Imaging TOF-SIMS for the surface analysis of silver halide microcrystals”. Lenaerts J, Gijbels R, van Vaeck L, Verlinden G, Geuens I, Applied surface science 203/204, 614 (2003). http://doi.org/10.1016/S0169-4332(02)00777-8
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 3.387
Times cited: 7
DOI: 10.1016/S0169-4332(02)00777-8
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“Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks”. de Witte H, Conard T, Vandervorst W, Gijbels R, Applied surface science 203, 523 (2003). http://doi.org/10.1016/S0169-4332(02)00728-6
Abstract: We analyzed ultra-thin ZrO2/SiO2/Si gate dielectrics under post-deposition anneals in dry O-2 at temperatures from 500 to 700 degreesC. TOF-SIMS profiling of ZrO2/SiO2/Si stacks is hampered by many sputter induced artifacts. The depletion of oxygen leads to a decrease in SIMS intensities. However, preferential sputtering is accompanied by transport of the depleted species towards the surface. Due to recoil implantation oxygen gets piled-up near the ZrO2/SiO2 interface. Either normal or radiation-enhanced diffusion transports oxygen back to the surface. Simultaneously also segregation of zirconium towards and through the interface is observed, resulting in a large zirconium tail in the underlying silicon substrate. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 3.387
Times cited: 15
DOI: 10.1016/S0169-4332(02)00728-6
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“Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study”. Ignatova VA, Conard T, Möller W, Vandervorst W, Gijbels R, Applied surface science 231/232, 603 (2004). http://doi.org/10.1016/j.apsusc.2004.03.121
Abstract: This study is dedicated to a better understanding of the processes occurring under ion bombardment of ultra-thin ZrO2/SiO2/Si gate dielectric stacks. Complex-shaped depth profiles were obtained by using TOF-SIMS with dual beam (500 eV for sputtering and 10 keV for analysis) Ar+ ions. The SIMS intensities of all the elements depend critically on the amount of oxygen at any moment of the sputtering process. Increased intensity is observed at the surface and at the ZrO2/SiO2 interface. A long tail of the Zr signal is present in the Si substrate, even after the second (SiO2/Si) interface, and a double bump structure in the Zr-90 and ZrO dimer is observed, which is more pronounced with increasing thickness of the interfacial SiO2 layer. Computer simulations using the dynamic Monte Carlo code (TRIDYN) are performed in order to distinguish the ion bombardment-induced effects from changes in the ionization degree. The original code is extended with simple models for the ionization mechanism and for the molecular yield during sputtering. Oxygen preferential sputtering at the surface and ballistic transport of Zr towards and through the interface are clearly demonstrated, but there is also evidence that due to recoil implantation oxygen gets piled-up near the ZrO2/SiO2 interface. (C) 2004 Elsevier B.V. All rights reserved.
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 3.387
Times cited: 4
DOI: 10.1016/j.apsusc.2004.03.121
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“Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 6.32
Times cited: 67
DOI: 10.1021/ac049108d
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“Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films”. Adriaensen L, Vangaever F, Lenaerts J, Gijbels R, Rapid communications in mass spectrometry 19, 1017 (2005). http://doi.org/10.1002/rcm.1881
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 1.998
Times cited: 24
DOI: 10.1002/rcm.1881
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“Microanalytical characterization of surface decoration in Majolica pottery”. Padilla R, Schalm O, Janssens K, Arrazcaeta R, van Espen P, Analytica chimica acta 535, 201 (2005). http://doi.org/10.1016/J.ACA.2004.11.082
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Impact Factor: 4.95
Times cited: 20
DOI: 10.1016/J.ACA.2004.11.082
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“Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/XRS.807
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“Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Impact Factor: 1.298
Times cited: 23
DOI: 10.1002/XRS.781
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“Characterization of uranium and plutonium containing particles originating from the nuclear weapons accident in Thule, Greenland, 1968”. Lind OC, Salbu B, Janssens K, Proost K, Dahlgaard H, Journal of environmental radioactivity 81, 21 (2005). http://doi.org/10.1016/J.JENVRAD.2004.10.013
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 2.31
Times cited: 37
DOI: 10.1016/J.JENVRAD.2004.10.013
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“Confocal micrometer-scale X-ray fluorescence and X-ray absorption fine structure studies of uranium speciation in a tertiary sediment from a waste disposal natural analogue site”. Denecke MA, Janssens K, Proost K, Rothe J, Noseck U, Environmental science and technology 39, 2049 (2005). http://doi.org/10.1021/ES048644K
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 6.198
Times cited: 47
DOI: 10.1021/ES048644K
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“Ultra-thin window electron probe microanalysis of suspended particles in tributaries of Lake Baikal, Siberia”. Semenov MY, Spolnik Z, Granina L, Van Grieken R, International journal of environmental analytical chemistry 85, 377 (2005). http://doi.org/10.1080/03067310500053944
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1080/03067310500053944
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“Crystal structure and properties of the new complex vanadium oxide K2SrV3O9”. Tsirlin AA, Chernaya VV, Shpanchenko RV, Antipov EV, Hadermann J, Materials research bulletin 40, 800 (2005). http://doi.org/10.1016/j.materresbull.2005.02.004
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.446
Times cited: 9
DOI: 10.1016/j.materresbull.2005.02.004
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“Mg1-xRhB, a new boridometallide with 2D polyanion”. Alekseeva AM, Abakumov AM, Leithe-Jasper A, Schnelle W, Prots Y, Hadermann J, Van Tendeloo G, Antipov EV, Grin Y, Zeitschrift für anorganische und allgemeine Chemie 631, 1047 (2005). http://doi.org/10.1002/zaac.200400479
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.144
Times cited: 13
DOI: 10.1002/zaac.200400479
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“Investigation of the chemical composition of (Na1-xBix)(MnyNb1-y)O3 ceramics by single particle electron probe X-ray microanalysis with an application of Monte Carlo simulations”. Spolnik Z, Osán J, Klepka M, Lawniczak-Jablonska K, Van Grieken R, Molak A, Potgieter JH, Spectrochimica acta: part B : atomic spectroscopy 60, 525 (2005). http://doi.org/10.1016/J.SAB.2005.03.013
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/J.SAB.2005.03.013
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“Influence of the characteristics of the STM-tip on the electroluminescence spectra”. Croitoru MD, Gladilin VN, Fomin VM, Devreese JT, Kemerink M, Koenraad PM, Sauthoff K, Wolter JH, Physica. E: Low-dimensional systems and nanostructures 27, 13 (2005). http://doi.org/10.1016/j.physe.2004.10.002
Keywords: A1 Journal article; Theory of quantum systems and complex systems; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT)
Impact Factor: 2.221
DOI: 10.1016/j.physe.2004.10.002
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“Role of the thermophoretic force on the transport of nanoparticles in dusty silane plasmas”. de Bleecker K, Bogaerts A, Goedheer W, Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics 71, 066405 (2005). http://doi.org/10.1103/PhysRevE.71.066405
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 2.366
Times cited: 25
DOI: 10.1103/PhysRevE.71.066405
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“Study of the Ar metastable atom population in a hollow cathode discharge by means of a hybrid model and spectrometric measurements”. Baguer N, Bogaerts A, Donko Z, Gijbels R, Sadeghi N, Journal of applied physics 97, 123305 (2005). http://doi.org/10.1063/1.1929857
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 2.068
Times cited: 40
DOI: 10.1063/1.1929857
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“Particle-in-cell Monte Carlo modeling of Langmuir probes in an Ar plasma”. Cenian A, Chernukho A, Bogaerts A, Gijbels R, Leys C, Journal of applied physics 97, 123310 (2005). http://doi.org/10.1063/1.1938275
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 2.068
Times cited: 18
DOI: 10.1063/1.1938275
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“Thin-window electron probe X-ray microanalysis of individual atmospheric particles above the North Sea”. de Hoog J, Osán J, Szalóki I, Eyckmans K, Worobiec A, Ro C-U, Van Grieken R, Atmospheric environment : an international journal 39, 3231 (2005). http://doi.org/10.1016/J.ATMOSENV.2005.02.025
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Laboratory Experimental Medicine and Pediatrics (LEMP)
DOI: 10.1016/J.ATMOSENV.2005.02.025
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“Micro-structural characterization of black crust and laser cleaning of building stones by micro-Raman and SEM techniques”. Potgieter-Vermaak SS, Godoi RHM, Van Grieken R, Potgieter JH, Oujja M, Castillejo M, Spectrochimica acta: part A: molecular and biomolecular spectroscopy 61, 2460 (2005). http://doi.org/10.1016/J.SAA.2004.09.010
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/J.SAA.2004.09.010
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