Number of records found: 502
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Citations
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Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics”. Krsmanovic R, Bals S, Bertoni G, Van Tendeloo G, Optical materials 30, 1183 (2008). http://doi.org/10.1016/j.optmat.2007.05.045
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3D imaging of nanomaterials by discrete tomography”. Batenburg KJ, Bals S, Sijbers J, Kübel C, Midgley PA, Hernandez JC, Kaiser U, Encina ER, Coronado EA, Van Tendeloo G, Ultramicroscopy 109, 730 (2009). http://doi.org/10.1016/j.ultramic.2009.01.009
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End-to-end assembly of shape-controlled nanocrystals via a nanowelding approach mediated by gold domains”. Figuerola A, Franchini IR, Fiore A, Mastria R, Falqui A, Bertoni G, Bals S, Van Tendeloo G, Kudera S, Cingolani R, Manna L, Advanced materials 21, 550 (2009). http://doi.org/10.1002/adma.200801928
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Transport, magnetic, and structural properties of La0.7Ce0.3MnO3 thin films: evidence for hole-doping”. Werner R, Raisch C, Leca V, Ion V, Bals S, Van Tendeloo G, Chasse T, Kleiner R, Koelle D, Physical review : B : solid state 79, 054416 (2009). http://doi.org/10.1103/PhysRevB.79.054416
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Quantitative three-dimensional modeling of zeotile through discrete electron tomography”. Bals S, Batenburg KJ, Liang D, Lebedev O, Van Tendeloo G, Aerts A, Martens JA, Kirschhock CE, Journal of the American Chemical Society 131, 4769 (2009). http://doi.org/10.1021/ja8089125
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Effect of amorphous layers on the interpretation of restored exit waves”. Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G, Ultramicroscopy 109, 237 (2009). http://doi.org/10.1016/j.ultramic.2008.10.024
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Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam”. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy 231, 359 (2008). http://doi.org/10.1111/j.1365-2818.2008.02055.x
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Combined TiO2/SiO2 mesoporous photocatalysts with location and phase controllable TiO2 nanoparticles”. Beyers E, Biermans E, Ribbens S, de Witte K, Mertens M, Meynen V, Bals S, Van Tendeloo G, Vansant EF, Cool P, Applied catalysis : B : environmental 88, 515 (2009). http://doi.org/10.1016/j.apcatb.2008.10.009
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The remarkable and intriguing resistance to oxidation of 2D ordered hcp Co nanocrystals: a new intrinsic property”. Lisiecki I, Turner S, Bals S, Pileni MP, Van Tendeloo G, Chemistry of materials 21, 2335 (2009). http://doi.org/10.1021/cm900284u
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
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TEM sample preparation by FIB for carbon nanotube interconnects”. Ke X, Bals S, Romo Negreira A, Hantschel T, Bender H, Van Tendeloo G, Ultramicroscopy 109, 1353 (2009). http://doi.org/10.1016/j.ultramic.2009.06.011
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Compositional changes of Pd-Au bimetallic nanoclusters upon hydrogenation”. di Vece M, Bals S, Lievens P, Van Tendeloo G, Physical review : B : solid state 80, 125420 (2009). http://doi.org/10.1103/PhysRevB.80.125420
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Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces”. Verbeeck J, Bals S, Lamoen D, Luysberg M, Huijben M, Rijnders G, Brinkman A, Hilgenkamp H, Blank DHA, Van Tendeloo G, Physical review : B : condensed matter and materials physics 81, 085113 (2010). http://doi.org/10.1103/PhysRevB.81.085113
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Assisted spray pyrolysis production and characterisation of ZnO nanoparticles with narrow size distribution”. Turner S, Tavernier SMF, Huyberechts G, Bals S, Batenburg KJ, Van Tendeloo G, Journal of nanoparticle research 12, 615 (2010). http://doi.org/10.1007/s11051-009-9630-1
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Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts”. Ke X, Bals S, Cott D, Hantschel T, Bender H, Van Tendeloo G, Microscopy and microanalysis 16, 210 (2010). http://doi.org/10.1017/S1431927609991371
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Three-dimensional characterization of helical silver nanochains mediated by protein assemblies”. Leroux F, Gysemans M, Bals S, Batenburg KJ, Snauwaert J, Verbiest T, van Haesendonck C, Van Tendeloo G, Advanced materials 22, 2193 (2010). http://doi.org/10.1002/adma.200903657
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Annular dark field imaging in a TEM”. Bals S, Kabius B, Haider M, Radmilovic V, Kisielowski C, Solid state communications 130, 675 (2004). http://doi.org/10.1016/j.ssc.2004.03.035
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Growth of R1+xBa2-xCu3O7-\delta epitaxial films investigated by in situ scanning tunneling microscopy”. Salluzzo M, Aruta C, Maggio-Aprile I, Fischer Ø, Bals S, Zegenhagen J, Physica status solidi: A: applied research 186, 339 (2001). http://doi.org/10.1002/1521-396X(200108)186:3<339::AID-PSSA339>3.0.CO;2-5
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Transmission electron microscopy investigation of Bi-2223/Ag tapes”. Gottschalck Andersen L, Bals S, Van Tendeloo G, Poulsen HF, Liu YL, Physica: C : superconductivity 353, 251 (2001). http://doi.org/10.1016/S0921-4534(00)01755-X
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Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications”. Lubyshev D, Fastenau JM, Fang X-M, Wu Y, Doss C, Snyder A, Liu WK, Lamb MSM, Bals S, Song C, Journal of vacuum science &, technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena 22, 1565 (2004). http://doi.org/10.1116/1.1691412
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Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813
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Modelling of synchrotron SAXS patterns of silicalite-1 zeolite during crystallization”. Aerts A, Follens LRA, Biermans E, Bals S, Van Tendeloo G, Loppinet B, Kirschhock CEA, Martens JA, Physical chemistry, chemical physics 13, 4318 (2011). http://doi.org/10.1039/c0cp01592j
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TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765
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An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images”. Croitoru MD, van Dyck D, Van Aert S, Bals S, Verbeeck J, Ultramicroscopy 106, 933 (2006). http://doi.org/10.1016/j.ultramic.2006.04.006
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A practical method to determine the effective resolution in incoherent experimental electron tomography”. Heidari Mezerji H, van den Broek W, Bals S, Ultramicroscopy 111, 330 (2011). http://doi.org/10.1016/j.ultramic.2011.01.021
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Electrodeposition of Ag nanoparticles onto carbon coated TEM grids : a direct approach to study early stages of nucleation”. Ustarroz J, Gupta U, Hubin A, Bals S, Terryn H, Electrochemistry communications 12, 1706 (2010). http://doi.org/10.1016/j.elecom.2010.10.002
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Measuring porosity at the nanoscale by quantitative electron tomography”. Biermans E, Molina L, Batenburg KJ, Bals S, Van Tendeloo G, Nano letters 10, 5014 (2010). http://doi.org/10.1021/nl103172r
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Well shaped Mn3O4 nano-octahedra with anomalous magnetic behavior and enhanced photodecomposition properties”. Li Y, Tan H, Yang X-Y, Goris B, Verbeeck J, Bals S, Colson P, Cloots R, Van Tendeloo G, Su B-L, Small 7, 475 (2011). http://doi.org/10.1002/smll.201001403
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Role of Nd/Ba substitution on the growth mode and on the structural properties of Nd-rich Re1(NdxBa2-x)Cu3O7-\delta (Re=Nd, Y) thin films”. Salluzzo M, Aruta C, Ausanio G, Bals S, d' Agostino A, Maglione MG, Physica: C : superconductivity 372-376, 675 (2002). http://doi.org/10.1016/S0921-4534(02)00828-6
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Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors”. Molina L, Tan H, Biermans E, Batenburg KJ, Verbeeck J, Bals S, Van Tendeloo G, Superconductor science and technology 24, 065019 (2011). http://doi.org/10.1088/0953-2048/24/6/065019
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