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Resonant magnetopolaron effects in GaAs/AlGaAs MQWs at high magnetic fields”. Wang YJ, Nickel HA, McCombe BD, Peeters FM, Hai GQ, Shi JM, Devreese JT, Wu XG, , 797 (1997)
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A cyclotron resonance study of the resonant polaron coupling in CdTe/CdMgTe quantum wells”. Chang CC, Michels JG, Cheng HH, Nicholas RJ, Peeters FM, Wu XG, Ossau W, Waag A, Landwehr G, , 383 (1997)
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Devices consisting of hybrid systems: ferro-magnetic and superconducting disks on top of a heterojunction”. Peeters FM, Li XQ, Matulis A, , 253 (1997)
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Laser microprobe mass spectrometry: local surface analysis of organic and inorganic compounds”. van Vaeck L, van Roy W, Struyf H, Poels K, Gijbels R Vch, Weinheim, page 354 (1997).
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Modeling of glow discharge ion sources for mass spectrometry: potentials and limitations”. Gijbels R, Bogaerts A, Spectroscopy 9, 8 (1997)
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Plasma models”. Bogaerts A, Gijbels R Wiley, New York, page 176 (1997).
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Modeling of glow discharges: what can we learn from it?”.Bogaerts A, Gijbels R, Analytical chemistry A-pages 69, 719 (1997)
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Magneto-polaron effect on shallow donors in 3D en Q2S systems”. Devreese JT, Shi JM, Peeters FM Kluwer, Dordrecht, page 173 (1993).
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Shallow-donor states in strongly-coupled super-lattices”. Shi JM, Peeters FM, Devreese JT, Bulletin of the American Physical Society 39, 488 (1994)
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Excited states of the one-dimensional bipolaron in the strong coupling limit”. Vansant P, Smondyrev MA, Peeters FM, Devreese JT, Bulletin of the American Physical Society 39, 889 (1994)
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Effects of DX centers on electronic structure of a ?-doped quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2355 (1996)
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Charged-impurity correlations in Si ?-doped GaAs”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Phase boundaries of superconducting mesoscopic square loops”. Fomin VM, Misko VR, Devreese JT, Moshchalkov VV, 12th International Conference on the Electronic Properties of Two-Dimensional Systems (EP2DS), Tokyo, 835 (1997)
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Modeling of bombardment induced oxidation of silicon with and without oxygen flooding”. de Witte H, Vandervorst W, Gijbels R, , 327 (1998)
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Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals”. Verlinden G, Gijbels R, Geuens I, Benninghoven A, , 871 (1998)
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Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods”. Verlinden G, Gijbels R, Geuens I, , 995 (1998)
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1997).
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Scanning microanalysis”. Oleshko V, Gijbels R Wiley-VCH, Weinheim, page 427 (1997).
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Pentcheva EN, Van 't dack L, Veldeman E, Hristov V, Gijbels R (1997) Hydrochemical characteristics of geothermal systems in South Bulgaria. University of Antwerp. Department of Chemistry, Antwerp
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Mass spectrometry, inorganic”. Adams F, Gijbels R, Jambers W, van Grieken R Wiley, Chichester, page 2650 (1998).
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Phase transitions in AC60 (A=Rb, Cs) fullerides”. Nikolaev AV, Prassides K, Michel KH, Recent advances in the chemistry and physics of fullerenes and related materials 5, 450 (1997)
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Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J Kluwer Academic, s.l., page 63 (1997).
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Metals and alloys”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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Amelinckx S, van Dyck D, van Landuyt J, Van Tendeloo G (1997) Handbook of microscopy: applications in materials science, solid-state physics and chemistry. Vch, Weinheim
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Structure determination of YBCO fluorinated phases by HREM”. Van Tendeloo G, Lebedev OI, Shpanchenko RV, Antipov EV, Journal of electron microscopy 1, 23 (1997)
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Amelinckx S, van Dyck D, van Landuyt J, Van Tendeloo G (1997) Electron microscopy: principles and fundamentals. Vch, Weinheim
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Hybrid magnetic-semiconductor nanostructures”. Peeters FM, de Boeck J Academic Press, New York, page 345 (1999).
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Scanning microanalysis”. Gijbels R, Oleshko V s.l., page 427 (1998).
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R Antwerp, page 528 (1998).
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