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  Author Title Year Publication Volume Times cited Additional Links (up) Links
Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E.P.; Rijnders, G. Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors 2020 Scientific Reports 10 18 UA library record; WoS full record; WoS citing articles pdf url doi
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