Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Horvath, Z.E.; Biro, L.P.; Van Tendeloo, G.; Tondeur, C.; Bister, G.; Pierard, N.; Fonseca, A.; Nagy, J.B. |
Optimization of the amount of catalyst and reaction time in single wall nanotube production |
2003 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
94 |
|
UA library record; WoS full record; WoS citing articles |
Cao, S.; Nishida, M.; Schryvers, D. |
FIB/SEM applied to quantitative 3D analysis of precipitates in Ni-Ti |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
|
UA library record; WoS full record |
Schryvers, D.; Tirry, W.; Cao, S. |
Advanced TEM and SEM methods applied to 3D nano- and microstructural investigations of Ni4Ti3 precipitates in Ni-Ti (SMA) |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
|
UA library record; WoS full record; WoS citing articles |
Delville, R.; Malard, B.; Pilch, J.; Sittner, P.; Schryvers, D. |
Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |
Delville, R.; Shi, H.; James, R.D.; Schryvers, D. |
Special microstructures and twin features in Ti50Ni50-x(Pd,Au)x at small hysteresis |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |