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Author
Title
Year
Publication
Volume
Times cited
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De wael, A.
;
De Backer, A.
;
Yu, C.-P.
;
Sentürk, D.G.
;
Lobato, I.
;
Faes, C.
;
Van Aert, S.
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM
2022
Microscopy and microanalysis
UA library record
;
WoS full record
Sentürk, D.G.
;
De Backer, A.
;
Friedrich, T.
;
Van Aert, S.
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors
2022
Ultramicroscopy
242
UA library record
;
WoS full record
;
WoS citing articles