Author |
Title |
Year |
Publication |
Volume |
Times cited |
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Shi, H.; Delville, R.; Srivastava, V.; James, R.D.; Schryvers, D. |
Microstructural dependence on middle eigenvalue in Ti-Ni-Au |
2013 |
Journal of alloys and compounds |
582 |
8 |
UA library record; WoS full record; WoS citing articles |
Delville, R.; Schryvers, D.; Zhang, Z.; James, R.D. |
Transmission electron microscopy investigation of microstructures in low-hysteresis alloys with special lattice parameters |
2009 |
Scripta materialia |
60 |
56 |
UA library record; WoS full record; WoS citing articles |
Delville, R.; Kasinathan, S.; Zhang, Z.; van Humbeeck, J.; James, R.D.; Schryvers, D. |
Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys |
2010 |
Philosophical magazine |
90 |
70 |
UA library record; WoS full record; WoS citing articles |
Delville, R.; James, R.D.; Salman, U.; Finel, A.; Schryvers, D. |
Transmission electron microscopy study of low-hysteresis shape memory alloys |
2009 |
|
|
3 |
UA library record; WoS full record; WoS citing articles |
Delville, R.; Shi, H.; James, R.D.; Schryvers, D. |
Special microstructures and twin features in Ti50Ni50-x(Pd,Au)x at small hysteresis |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |
Chen, X.; Cao, S.; Ikeda, T.; Srivastava, V.; Snyder, G.J.; Schryvers, D.; James, R.D. |
A weak compatibility condition for precipitation with application to the microstructure of PbTe-Sb2Te3 thermoelectrics |
2011 |
Acta materialia |
59 |
8 |
UA library record; WoS full record; WoS citing articles |