Records |
Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
Title |
High resolution electron microscopy from imaging towards measuring |
Type |
H2 Book chapter |
Year |
2001 |
Publication |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
Abbreviated Journal |
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Volume |
|
Issue |
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Pages |
2081-2086 |
Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Ieee |
Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2002-11-13 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
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Edition |
|
ISSN |
|
ISBN |
0-7803-6646-8 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:136870 |
Serial |
4501 |
Permanent link to this record |
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|
|
Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Title |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
Type |
H1 Book chapter |
Year |
2004 |
Publication |
|
Abbreviated Journal |
Adv Imag Elect Phys |
Volume |
|
Issue |
|
Pages |
1-164 |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
Academic Press |
Place of Publication |
San Diego, Calif. |
Editor |
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Language |
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Wos |
000223226700001 |
Publication Date |
2011-01-05 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1076-5670; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
|
Times cited |
13 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:47513 |
Serial |
3156 |
Permanent link to this record |
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|
|
Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Title |
High-resolution electron microscopy : from imaging toward measuring |
Type |
A1 Journal article |
Year |
2002 |
Publication |
IEEE transactions on instrumentation and measurement |
Abbreviated Journal |
Ieee T Instrum Meas |
Volume |
51 |
Issue |
4 |
Pages |
611-615 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
New York, N.Y. |
Editor |
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Language |
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Wos |
000178992000010 |
Publication Date |
2003-01-03 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0018-9456; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.456 |
Times cited |
13 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 2.456; 2002 IF: 0.592 |
Call Number |
UA @ lucian @ c:irua:47521 |
Serial |
1450 |
Permanent link to this record |