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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Lobato, I.
;
De Backer, A.
;
Van Aert, S.
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network
2023
Ultramicroscopy
251
UA library record
;
WoS full record
Lobato, I.
;
Friedrich, T.
;
Van Aert, S.
Deep convolutional neural networks to restore single-shot electron microscopy images
2024
N P J Computational Materials
10
UA library record
;
WoS full record
