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| Record | |||||
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| Author | Luyten, W.; Van Tendeloo, G.; Amelinckx, S.; Collins, J.L. | ||||
| Title | Electron microscopy study of defects in synthetic diamond layers | Type | A1 Journal article | ||
| Year | 1992 | Publication | Philosophical magazine: A: physics of condensed matter: defects and mechanical properties | Abbreviated Journal | |
| Volume | 66 | Issue | 6 | Pages | 899-915 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor  |
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| Language | Wos | A1992KC54700003 | Publication Date | 2007-07-08 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0141-8610;1460-6992; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 36 | Open Access | ||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:4446 | Serial | 970 | ||
| Permanent link to this record | |||||