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Author | Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Ju, H.L.; Krishnan, K.M. | ||||
Title | High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films | Type | A1 Journal article | ||
Year | 2000 | Publication | Philosophical magazine: A: physics of condensed matter: defects and mechanical properties | Abbreviated Journal | Philos Mag A |
Volume | 80 | Issue | 3 | Pages | 673-691 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | London | Editor | ||
Language | Wos | 000085873500011 | Publication Date | 2007-07-08 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0141-8610;1460-6992; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 52 | Open Access | ||
Notes | IUAP 4-10; reprint | Approved | Most recent IF: NA | ||
Call Number | UA @ lucian @ c:irua:54751 | Serial | 1456 | ||
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