Number of records found: 335
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Citations
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The use of surface analysis techniques and isotope mass spectrometry for the study of water-rock interactions of interest in hot-dry rock technology”. Adriaens A, van Nevel L, Van 't dack L, de Bièvre P, Adams F, Gijbels R, , 2541 (1995)
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XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers”. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films 343/344, 583 (1999). http://doi.org/10.1016/S0040-6090(99)00122-4
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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Adams F, Gijbels R, Van Grieken R, Dachang Z (1993) Inorganic mass spectrometry. Fudan University Press, Shanghai, 391 p
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Inorganic mass spectrometry”. Adams F, Gijbels R, Van Grieken R Wiley, Chichester, page 404 p. (1988).
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