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“Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach”. Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D, Micron 94, 66 (2017). http://doi.org/10.1016/j.micron.2016.12.005
Abstract: Twin-jet electro-polishing and Focused Ion Beam (FIB) were combined to produce small size Nickel single crystal specimens for quantitative in-situ nanotensile experiments in the transmission electron microscope. The combination of these techniques allows producing samples with nearly defect-free zones in the centre in contrast to conventional FIB-prepared samples. Since TEM investigations can be performed on the electro-polished samples prior to in-situ TEM straining, specimens with desired crystallographic orientation and initial microstructure can be prepared. The present results reveal a dislocation nucleation controlled plasticity, in which small loops induced by FIB near the edges of the samples play a central role.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.98
Times cited: 11
DOI: 10.1016/j.micron.2016.12.005
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“Dislocation structures and the role of grain boundaries in cyclically deformed Ni micropillars”. Samaee V, Sandfeld S, Idrissi H, Groten J, Pardoen T, Schwaiger R, Schryvers D, Materials Science And Engineering A-Structural Materials Properties Microstructure And Processing 769, 138295 (2020). http://doi.org/10.1016/j.msea.2019.138295
Abstract: Transmission electron microscopy and finite element-based dislocation simulations were combined to study the development of dislocation microstructures after cyclic deformation of single crystal and bicrystal Ni micropillars oriented for multi-slip. A direct correlation between large accumulation of plastic strain and the presence of dislocation cell walls in the single crystal micropillars was observed, while the presence of the grain boundary hampered the formation of wall-like structures in agreement with a smaller accumulated plastic strain. Automated crystallographic orientation and nanostrain mapping using transmission electron microscopy revealed the presence of lattice heterogeneities associated to the cell walls including long range elastic strain fields. By combining the nanostrain mapping with an inverse modelling approach, information about dislocation density, line orientation and Burgers vector direction was derived, which is not accessible otherwise in such dense dislocation structures. Simulations showed that the image forces associated with the grain boundary in this specific bicrystal configuration have only a minor influence on dislocation behavior. Thus, the reduced occurrence of “mature” cell walls in the bicrystal can be attributed to the available volume, which is too small to accommodate cell structures.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 6.4
Times cited: 1
DOI: 10.1016/j.msea.2019.138295
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“Datasets for the analysis of dislocations at grain boundaries and during vein formation in cyclically deformed Ni micropillars”. Sandfeld S, Samaee V, Idrissi H, Groten J, Pardoen T, Schwaiger R, Schryvers D, Data in Brief 27, 104724 (2019). http://doi.org/10.1016/J.DIB.2019.104724
Abstract: The dataset together with the corresponding Python scripts and Jupyter notebooks presented in this article are supplementary data for the work presented in Samaee et al., 2019 [1]. The data itself consists of two parts: the simulation data that was used in [1] to analyze the effect of a particular grain boundary on curved dislocations and the precession electron diffraction (PED) strain maps together with post-processed data for analyzing details of the observed dislocation vein structures. Additionally, the complete stress tensor components, which are not shown in [1], have also been included. The data sets are accompanied by Python code explaining the file formats and showing how to post-process the data. (c) 2019 The Author(s). Published by Elsevier Inc. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
DOI: 10.1016/J.DIB.2019.104724
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