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  Author Title Year Publication Volume Times cited Additional Links Links
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. Inelastic electron holography as a variant of the Feynman thought experiment 2007 Ultramicroscopy 107 13 UA library record; WoS full record; WoS citing articles pdf doi
Fanidis, C.; van Dyck, D.; van Landuyt, J. Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework 1992 Ultramicroscopy 41 17 UA library record; WoS full record; WoS citing articles doi
Fanidis, C.; van Dyck, D.; van Landuyt, J. Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases 1993 Ultramicroscopy 48 6 UA library record; WoS full record; WoS citing articles
Verbeeck, J. Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring 2006 Ultramicroscopy 106 8 UA library record; WoS full record; WoS citing articles pdf doi
Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays 2013 Ultramicroscopy 134 1 UA library record; WoS full record; WoS citing articles pdf url doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; Chen, J.H.; van Dyck, D. Linear versus non-linear structural information limit in high-resolution transmission electron microscopy 2010 Ultramicroscopy 110 6 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles pdf doi
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. Measurement of specimen thickness by phase change determination in TEM 2008 Ultramicroscopy 108 2 UA library record; WoS full record; WoS citing articles doi
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles doi
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. A method to determine the local surface profile from reconstructed exit waves 2011 Ultramicroscopy 111 3 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based atomic resolution tomographic algorithm 2009 Ultramicroscopy 109 17 UA library record; WoS full record; WoS citing articles doi
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Van Aert, S.; Bertoni, G. Model-based quantification of EELS spectra: including the fine structure 2006 Ultramicroscopy 106 38 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G. Model-based quantification of EELS spectra: treating the effect of correlated noise 2008 Ultramicroscopy 108 16 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy 2010 Ultramicroscopy 110 16 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Kilaas, R.; Kisielowski, C. Nonlinear imaging using annular dark field TEM 2005 Ultramicroscopy 104 15 UA library record; WoS full record; WoS citing articles pdf doi
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. On the interpretation of HREM images of partially ordered alloys 1995 Ultramicroscopy 60 20 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. Optimal aperture sizes and positions for EMCD experiments 2008 Ultramicroscopy 108 27 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
Tan, H.; Verbeeck, J.; Abakumov, A.; Van Tendeloo, G. Oxidation state and chemical shift investigation in transition metal oxides by EELS 2012 Ultramicroscopy 116 413 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. Plasmon holographic experiments: theoretical framework 2005 Ultramicroscopy 102 43 UA library record; WoS full record; WoS citing articles pdf doi
Heidari Mezerji, H.; van den Broek, W.; Bals, S. A practical method to determine the effective resolution in incoherent experimental electron tomography 2011 Ultramicroscopy 111 26 UA library record; WoS full record; WoS citing articles pdf doi
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? 2012 Ultramicroscopy 114 5 UA library record; WoS full record; WoS citing articles pdf doi
Chen, D.; Goris, B.; Bleichrodt, F.; Heidari Mezerji, H.; Bals, S.; Batenburg, K.J.; de With, G.; Friedrich, H. The properties of SIRT, TVM, and DART for 3D imaging of tubular domains in nanocomposite thin-films and sections 2014 Ultramicroscopy 147 42 UA library record; WoS full record; WoS citing articles pdf url doi
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy 2006 Ultramicroscopy 106 83 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
Schattschneider, P.; Verbeeck, J.; Hamon, A.L. Real space maps of atomic transitions 2009 Ultramicroscopy 109 10 UA library record; WoS full record; WoS citing articles doi
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J.; Mauchamp, V.; Jaouen, M. Real space maps of magnetic moments on the atomic scale: theory and feasibility 2010 Ultramicroscopy 110 10 UA library record; WoS full record; WoS citing articles pdf doi
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